Abstract: An optical system can include a receiver secured to a first optical component and a flexure arrangement secured to a second optical component. The flexure arrangement can include a plurality of flexures, each with a free end that can extend away from the second optical component and into a corresponding cavity of the receiver. Each of the cavities can be sized to receive adhesive that secures the corresponding flexure within the cavity when the adhesive has hardened, and to permit adjustment of the corresponding flexure within the cavity, before the adhesive has hardened, to adjust an alignment of the first and second optical components relative to multiple degrees of freedom.

Abstract: An opto-electronic system includes a laser operable to produce a laser beam; an optical element including two or more beam-shaping portions, each of the two or more beam-shaping portions having a different optical property; a beam deflector arranged to sweep the laser beam across the optical element to produce output light; and electronics communicatively coupled with the laser, the beam deflector, or both the laser and the beam deflector. The electronics are configured to cause selective impingement of the laser beam onto a proper subset of the two or more beam-shaping portions of the optical element to modify one or more optical parameters of the output light.

Abstract: An optical system can include a receiver secured to a first optical component and a flexure arrangement secured to a second optical component. The flexure arrangement can include a plurality of flexures, each with a free end that can extend away from the second optical component and into a corresponding cavity of the receiver. Each of the cavities can be sized to receive adhesive that secures the corresponding flexure within the cavity when the adhesive has hardened, and to permit adjustment of the corresponding flexure within the cavity, before the adhesive has hardened, to adjust an alignment of the first and second optical components relative to multiple degrees of freedom.

Abstract: An optical system can include a receiver secured to a first optical component and a flexure arrangement secured to a second optical component. The flexure arrangement can include a plurality of flexures, each with a free end that can extend away from the second optical component and into a corresponding cavity of the receiver. Each of the cavities can be sized to receive adhesive that secures the corresponding flexure within the cavity when the adhesive has hardened, and to permit adjustment of the corresponding flexure within the cavity, before the adhesive has hardened, to adjust an alignment of the first and second optical components relative to multiple degrees of freedom.

Abstract: A positioning system for an optical system can include a support frame and a flexure arrangement. The flexure arrangement can be configured to secure an optical-system component relative to a support frame, with the optical-system component in a first orientation. The flexure arrangement can be configured to resiliently deform, upon application of a transient stress to the optical system, to move the optical-system component relative to the support frame along at least one degree of freedom. The flexure arrangement can be configured to return the optical-system component to the first orientation upon removal of the transient stress.

Abstract: A positioning system for an optical system can include a support frame and a flexure arrangement. The flexure arrangement can be configured to secure an optical-system component relative to a support frame, with the optical-system component in a first orientation. The flexure arrangement can be configured to resiliently deform, upon application of a transient stress to the optical system, to move the optical-system component relative to the support frame along at least one degree of freedom. The flexure arrangement can be configured to return the optical-system component to the first orientation upon removal of the transient stress.

Abstract: The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

Abstract: A positioning system for an optical system can include a support frame and a flexure arrangement. The flexure arrangement can be configured to secure an optical-system component relative to a support frame, with the optical-system component in a first orientation. The flexure arrangement can be configured to resiliently deform, upon application of a transient stress to the optical system, to move the optical-system component relative to the support frame along at least one degree of freedom. The flexure arrangement can be configured to return the optical-system component to the first orientation upon removal of the transient stress.

Abstract: The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

Abstract: The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

Abstract: The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

Abstract: An illumination assembly is provided for use with a light source and an illumination target. A first light collector can be disposed to receive and direct light from the light source. A first diffuser can be disposed at least partly between the first light collector and the illumination target. The first diffuser can be configured to diffuse at least part of the light directed by the first light collector to provide a first illumination pattern on the illumination target.

Abstract: An illumination assembly is provided for use with a light source and an illumination target. A first light collector can be disposed to receive and direct light from the light source. A first diffuser can be disposed at least partly between the first light collector and the illumination target. The first diffuser can be configured to diffuse at least part of the light directed by the first light collector to provide a first illumination pattern on the illumination target.

Abstract: Deformations of a surface of a test object can be measured by attaching mirrors to a surface of a test object, each mirror having a reflective surface with a dimension and a radius of curvature smaller than those of the surface of the test object. Light is directed towards the mirrors and a reference surface, and interference patterns are generated using light reflected from the mirrors and the reference surface. Changes in the surface of the test object are determined based on the interference patterns.

Abstract: Deformations of a surface of a test object can be measured by attaching mirrors to a surface of a test object, each mirror having a reflective surface with a dimension and a radius of curvature smaller than those of the surface of the test object. Light is directed towards the mirrors and a reference surface, and interference patterns are generated using light reflected from the mirrors and the reference surface. Changes in the surface of the test object are determined based on the interference patterns.