Abstract: An electronic clock tuning system for a digital computer of the type including a plurality of major function circuit boards comprised of a plurality of gate arrays. A clock pulse train is produced by a master oscillator, and distributed to each major function circuit board by a master fanout. The clock pulse train is distributed throughout each major function circuit board by a local fanout. Each major function circuit board includes a plurality of electronic delay arrays, each of which distributes the clock pulse train to a group of gate arrays on the major function board, and delays the clock pulse train supplied to each gate array by one of a plurality of discrete delay periods. Each electronic delay array includes shift registers for serially receiving digital delay tuning codes and for producing digital delay select signals representative of discrete delay periods.

Abstract: A large-scale integrated circuit (LSI) chip has an individual voltage level sensing circuit connected with each input and output connecting pin so that isolation between the pins is maintained and so that the individual level sensor output can provide an indication of an abnormal voltage on the input/output pin. The outputs of all level sensors for all input and output pins is connected in common to the input of a comparator circuit. The comparator circuit has a fault detection threshold voltage input and provides a fault indication output signal whenever the voltage input from the level sensor circuits is outside of the detection threshold voltage range. A number of logic chips will have particular input/output pins connected together in a circuit in conventional applications. An open circuit anywhere in the interconnected network will cause some number of input/output pins dependent on the fault location to be pulled out of the detection threshold voltage range.