Patents by Inventor John J. Sidorowich
John J. Sidorowich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9317593Abstract: In one embodiment, modeling topics includes accessing a corpus comprising documents that include words. Words of a document are selected as keywords of the document. The documents are clustered according to the keywords to yield clusters, where each cluster corresponds to a topic. A statistical distribution is generated for a cluster from words of the documents of the cluster. A topic is modeled using the statistical distribution generated for the cluster corresponding to the topic.Type: GrantFiled: October 1, 2008Date of Patent: April 19, 2016Assignee: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Yannis Labrou
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Patent number: 9081852Abstract: In one embodiment, a set of target search terms for a search is received. Candidate terms are selected, where a candidate term is selected to reduce an ontology space of the search. The candidate terms are sent to a computer to recommend the candidate terms as search terms. In another embodiment, a document stored in one or more tangible media is accessed. A set of target tags for the document is received. Terms are selected, where a term is selected to reduce an ontology space of the document. The terms are sent to a computer to recommend the terms as tags.Type: GrantFiled: October 1, 2008Date of Patent: July 14, 2015Assignee: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Albert Reinhardt, Yannis Labrou
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Patent number: 8280892Abstract: In one embodiment, assigning tags to a document includes accessing the document, where the document comprises text units that include words. The following is performed for each text unit: a subset of words of a text unit is selected as candidate tags, relatedness is established among the candidate tags, and certain candidate tags are selected according to the established relatedness to yield a candidate tag set for the text unit. Relatedness between the candidate tags of each candidate tag set and the candidate tags of other candidate tag sets is determined. At least one candidate tag is assigned to the document according to the determined relatedness.Type: GrantFiled: October 1, 2008Date of Patent: October 2, 2012Assignee: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Yannis Labrou
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Patent number: 8108392Abstract: In one embodiment, identifying clusters of words includes accessing a record that records affinities. An affinity between a first and second word describes a quantitative relationship between the first and second word. Clusters of words are identified according to the affinities. A cluster comprises words that are sufficiently affine with each other. A first word is sufficiently affine with a second word if the affinity between the first and second word satisfies one or more affinity criteria. A clustering analysis is performed using the clusters.Type: GrantFiled: October 1, 2008Date of Patent: January 31, 2012Assignee: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich
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Publication number: 20090094231Abstract: In one embodiment, assigning tags to a document includes accessing the document, where the document comprises text units that include words. The following is performed for each text unit: a subset of words of a text unit is selected as candidate tags, relatedness is established among the candidate tags, and certain candidate tags are selected according to the established relatedness to yield a candidate tag set for the text unit. Relatedness between the candidate tags of each candidate tag set and the candidate tags of other candidate tag sets is determined. At least one candidate tag is assigned to the document according to the determined relatedness.Type: ApplicationFiled: October 1, 2008Publication date: April 9, 2009Applicant: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Yannis Labrou
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Publication number: 20090094020Abstract: In one embodiment, a set of target search terms for a search is received. Candidate terms are selected, where a candidate term is selected to reduce an ontology space of the search. The candidate terms are to a computer to recommend the candidate terms as search terms. In another embodiment, a document stored in one or more tangible media is accessed. A set of target tags for the document is received. Terms are selected, where a term is selected to reduce an ontology space of the document. The terms are sent to a computer to recommend the terms as tags.Type: ApplicationFiled: October 1, 2008Publication date: April 9, 2009Applicant: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Albert Reinhardt, Yannis Labrou
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Publication number: 20090094233Abstract: In one embodiment, modeling topics includes accessing a corpus comprising documents that include words. Words of a document are selected as keywords of the document. The documents are clustered according to the keywords to yield clusters, where each cluster corresponds to a topic. A statistical distribution is generated for a cluster from words of the documents of the cluster. A topic is modeled using the statistical distribution generated for the cluster corresponding to the topic.Type: ApplicationFiled: October 1, 2008Publication date: April 9, 2009Applicant: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich, Yannis Labrou
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Publication number: 20090094207Abstract: In one embodiment, identifying clusters of words includes accessing a record that records affinities. An affinity between a first and second word describes a quantitative relationship between the first and second word. Clusters of words are identified according to the affinities. A cluster comprises words that are sufficiently affine with each other. A first word is sufficiently affine with a second word if the affinity between the first and second word satisfies one or more affinity criteria. A clustering analysis is performed using the clusters.Type: ApplicationFiled: October 1, 2008Publication date: April 9, 2009Applicant: Fujitsu LimitedInventors: David L. Marvit, Jawahar Jain, Stergios Stergiou, Alex Gilman, B. Thomas Adler, John J. Sidorowich
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Patent number: 7050179Abstract: An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.Type: GrantFiled: March 2, 2004Date of Patent: May 23, 2006Assignee: Therma-Wave, Inc.Inventor: John J. Sidorowich
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Publication number: 20040172202Abstract: An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.Type: ApplicationFiled: March 2, 2004Publication date: September 2, 2004Inventor: John J. Sidorowich
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Patent number: 6781706Abstract: An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.Type: GrantFiled: January 22, 2003Date of Patent: August 24, 2004Assignee: Therma-Wave, Inc.Inventor: John J. Sidorowich
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Publication number: 20030128372Abstract: An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.Type: ApplicationFiled: January 22, 2003Publication date: July 10, 2003Inventor: John J. Sidorowich
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Patent number: 6532076Abstract: An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.Type: GrantFiled: April 4, 2000Date of Patent: March 11, 2003Assignee: Therma-Wave, Inc.Inventor: John J. Sidorowich
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Patent number: 5953446Abstract: An optical inspection device generates a plurality of measured optical data from inspection of a thin film stack. A processor evolves models of theoretical data, which are compared to the measured data, and a "best fit" solution is provided as the result. Each model of theoretical data is represented by an underlying "genotype" which is an ordered list of "genes." Each gene corresponds to a selected thin film parameter of interest. Many such individual genotypes are created thereby forming a "population" of genotypes, which are evolved through the use of a genetic algorithm. Each genotype has a fitness associated therewith based on how much the theoretical data derived therefrom differs from the measured data. Individual genotypes are selected based on fitness, then a genetic operation is performed on the selected genotypes to produce new genotypes. Multiple generations of genotypes are evolved until an acceptable solution is obtained.Type: GrantFiled: October 9, 1998Date of Patent: September 14, 1999Assignee: Therma-Wave, Inc.Inventors: Jon Opsal, John J. Sidorowich
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Patent number: 5864633Abstract: An optical inspection device generates a plurality of measured optical data from inspection of a thin film stack. A processor evolves models of theoretical data, which are compared to the measured data, and a "best fit" solution is provided as the result. Each model of theoretical data is represented by an underlying "genotype" which is an ordered list of "genes." Each gene corresponds to a selected thin film parameter of interest. Many such individual genotypes are created thereby forming a "population" of genotypes, which are evolved through the use of a genetic algorithm. Each genotype has a fitness associated therewith based on how much the theoretical data derived therefrom differs from the measured data. Individual genotypes are selected based on fitness, then a genetic operation is performed on the selected genotypes to produce new genotypes. Multiple generations of genotypes are evolved until an acceptable solution is obtained.Type: GrantFiled: May 17, 1996Date of Patent: January 26, 1999Assignee: Therma-Wave, Inc.Inventors: Jon Opsal, John J. Sidorowich