Patents by Inventor John James Ritsko

John James Ritsko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Structural design and processes to control probe position accuracy in a wafer test probe assembly
    Publication number: 20030048108
    Abstract: The present invention is directed to a structure comprising a substrate having a surface; a plurality of elongated electrical conductors extending away from the surface; each of said elongated electrical conductors having a first end affixed to the surface and a second end projecting away from the surface; there being a plurality of second ends; and a means for positioning and maintaining the plurality of the second ends in substantially fixed positions with respect to each other. The structure is useful as a probe for testing and burning in integrated circuit chips at the wafer level.
    Type: Application
    Filed: May 14, 2002
    Publication date: March 13, 2003
    Inventors: Brian Samuel Beaman, Fuad Elias Doany, Keith Edward Fogel, James Lupton Hedrick, Paul Alfred Lauro, Maurics Heathcote Norcott, John James Ritsko, Sang-Hyon Paek, Leathen Shi, Da-Yuan Shih, George Frederick Walker