Abstract: A computer method of analyzing an integrated circuit (“IC”) masked design data, comprising grouping into a cluster areas of layers preceding a target metal layer that are suitable for milling, deleting portions of the target metal layer that do not meet minimum tool spacing requirements to produce a modified metal layer, deleting portions of the modified metal layer that do not meet minimum design rule width requirements to produce a final metal layer, and comparing the final metal layer and the cluster to identify common areas.

Abstract: A multifunction data storage register is provided having at least one first register cell having a first input multiplexer for selecting between two input signals responsive to one or more control signals and having a first output signal, a first input exclusive not OR circuit having a first input connected to said first output signal of said first input multiplexer and a second input connected to a cell output signal and having a third output signal, a first shift register latch having an input connected to said third output signal of said first input exclusive not OR circuit and having a fourth output signal, a first output exclusive not OR circuit having a first input connected to said fourth output signal of said first shift register latch and a second input connected to a feedback signal and having a fifth output signal, and a first output multiplexer for selecting between said fifth output signal and said fourth output signal responsive to said one or more control signals and having a first cell output