Patents by Inventor John Ould
John Ould has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240142229Abstract: A method of communicating information to a measurement probe mounted on a coordinate positioning machine includes encoding the information as one or more of a plurality of characteristic movements of the probe, controlling the machine to impart the movement(s) to the probe, detecting the movement(s) at the probe, and decoding the information at the probe from the detected movement(s). A measurement probe for use in such a method is mountable to the machine and includes at least one movement sensor for sensing movement imparted to the measurement probe by the machine, and a controller for determining whether the sensed movement includes one or more of the plurality of characteristic movements of the probe and for performing an operation at or controlling operation of the probe in dependence on the determination.Type: ApplicationFiled: March 1, 2022Publication date: May 2, 2024Applicant: RENISHAW PLCInventors: Jamie John BUCKINGHAM, Derek MARSHALL, John Charles OULD
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Patent number: 11948224Abstract: One embodiment provides an apparatus comprising a memory stack including multiple memory dies and a parallel processor including a plurality of multiprocessors. Each multiprocessor has a single instruction, multiple thread (SIMT) architecture, the parallel processor coupled to the memory stack via one or more memory interfaces. At least one multiprocessor comprises a multiply-accumulate circuit to perform multiply-accumulate operations on matrix data in a stage of a neural network implementation to produce a result matrix comprising a plurality of matrix data elements at a first precision, precision tracking logic to evaluate metrics associated with the matrix data elements and indicate if an optimization is to be performed for representing data at a second stage of the neural network implementation, and a numerical transform unit to dynamically perform a numerical transform operation on the matrix data elements based on the indication to produce transformed matrix data elements at a second precision.Type: GrantFiled: November 1, 2022Date of Patent: April 2, 2024Assignee: Intel CorporationInventors: Elmoustapha Ould-Ahmed-Vall, Sara S. Baghsorkhi, Anbang Yao, Kevin Nealis, Xiaoming Chen, Altug Koker, Abhishek R. Appu, John C. Weast, Mike B. Macpherson, Dukhwan Kim, Linda L. Hurd, Ben J. Ashbaugh, Barath Lakshmanan, Liwei Ma, Joydeep Ray, Ping T. Tang, Michael S. Strickland
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Publication number: 20240086138Abstract: In accordance with some embodiments, the render rate is varied across and/or up and down the display screen. This may be done based on where the user is looking in order to reduce power consumption and/or increase performance. Specifically the screen display is separated into regions, such as quadrants. Each of these regions is rendered at a rate determined by at least one of what the user is currently looking at, what the user has looked at in the past and/or what it is predicted that the user will look at next. Areas of less focus may be rendered at a lower rate, reducing power consumption in some embodiments.Type: ApplicationFiled: September 26, 2023Publication date: March 14, 2024Inventors: Eric J. Asperheim, Subramaniam Maiyuran, Kiran C. Veernapu, Sanjeev S. Jahagirdar, Balaji Vembu, Devan Burke, Philip R. Laws, Kamal Sinha, Abhishek R. Appu, Elmoustapha Ould-Ahmed-Vall, Peter L. Doyle, Joydeep Ray, Travis T. Schluessler, John H. Feit, Nikos Kaburlasos, Jacek Kwiatkowski, Altug Koker
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Patent number: 10678208Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.Type: GrantFiled: June 14, 2018Date of Patent: June 9, 2020Assignee: RENISHAW PLCInventors: Michael Wooldridge, Paul Moore, John Ould
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Publication number: 20180364676Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.Type: ApplicationFiled: June 14, 2018Publication date: December 20, 2018Applicant: RENISHAW PLCInventors: Michael WOOLDRIDGE, Paul MOORE, John OULD
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Patent number: 10132622Abstract: A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path.Type: GrantFiled: February 3, 2014Date of Patent: November 20, 2018Assignee: RENISHAW PLCInventor: John Ould
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Patent number: 10037017Abstract: A method of scanning an object using an analog probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analog probe having a preferred measurement range. The method includes controlling the analog probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analog probe will be caused to obtain data within its preferred measuring range, as well as cause the analog probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.Type: GrantFiled: April 16, 2013Date of Patent: July 31, 2018Assignee: RENISHAW PLCInventors: Michael Wooldridge, Paul Moore, John Ould
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Patent number: 9952028Abstract: A method of finding a feature of an object using an analog probe mounted on a machine tool. The method includes the analog probe and/or object following a course of motion which causes the analog probe's surface sensing region to traverse across the feature to be found a plurality of times while approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.Type: GrantFiled: May 25, 2017Date of Patent: April 24, 2018Assignee: RENISHAW PLCInventors: John Ould, Kevin Tett
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Publication number: 20170261305Abstract: A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.Type: ApplicationFiled: May 25, 2017Publication date: September 14, 2017Applicant: RENISHAW PLCInventors: John OULD, Kevin TETT
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Patent number: 9733060Abstract: A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.Type: GrantFiled: April 16, 2013Date of Patent: August 15, 2017Assignee: RENISHAW PLCInventors: John Ould, Kevin Tett
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Patent number: 9726481Abstract: A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.Type: GrantFiled: April 16, 2013Date of Patent: August 8, 2017Assignee: RENISHAW PLCInventors: David Roberts McMurtry, John Ould, Tim Prestidge, Iain Ainsworth
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Publication number: 20150377617Abstract: A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path.Type: ApplicationFiled: February 3, 2014Publication date: December 31, 2015Inventor: John OULD
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Publication number: 20150121710Abstract: A method of building up a measurement data set for a surface of an object using an analogue measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analogue probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.Type: ApplicationFiled: April 16, 2013Publication date: May 7, 2015Inventors: David Roberts McMurtry, John Ould, Tim Prestidge, Iain Ainsworth
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Publication number: 20150101204Abstract: A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.Type: ApplicationFiled: April 16, 2013Publication date: April 16, 2015Applicant: RENISHAW PLCInventors: John Ould, Kevin Tett
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Publication number: 20150066196Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.Type: ApplicationFiled: April 16, 2013Publication date: March 5, 2015Applicant: RENISHAW PLCInventors: Michael Wooldridge, Paul Moore, John Ould
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Publication number: 20070250204Abstract: A machine tool program editor (42) is used to insert auxiliary operations e.g. measurement, process control and program logic into a CNC work producing program. The editor (42) has representations (50, FIG. 3) of the operations which can be placed in the correct position in the program. User input in the form of parameters is prompted when a representation is selected. The program is post processed (46) and run on a machine tool (30) whereat the operations are performed.Type: ApplicationFiled: June 28, 2005Publication date: October 25, 2007Applicant: RENISHAW PLCInventors: John Ould, Sam Whale, Kevin Tett, Matthew Powley, Alexander Kane
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Publication number: 20070005178Abstract: A method for producing a measurement probe 30 inspection path on a machine tool is disclosed which includes the step of running a program e.g. a modified CAM editor program 44 which allows the selection of geometric features of a workpiece 34 to be inspected. Once selected the program will generate a measurement probe path which is included in software for loading into the numeric controller (NC) of the machine tool. The software can have cutting commands together with inspection path instructions either readable by the NC or written as unreadable instructions for use with a p.c. 20 connected to the NC controller and preferably operating at the same time as the NC.Type: ApplicationFiled: February 13, 2004Publication date: January 4, 2007Applicant: RENISHAW PLCInventors: Tim Prestidge, John Ould