Patents by Inventor John S. Williamson

John S. Williamson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6732763
    Abstract: This invention provides stretch-resistant liners for lining pipes, pipes lined with stretch-resistant liners, and methods for lining pipes with stretch-resistant liners. The liners are made from a layer of stretch-resistant woven material, which may be a scrim, sandwiched between two layers of non-woven resin-impregnated material to form a laminate structure which is rolled into a tube to provide a liner having concentric sleeves.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: May 11, 2004
    Assignee: Lantor, Inc.
    Inventors: John S. Williamson, Jin Choi
  • Publication number: 20030217777
    Abstract: This invention provides stretch-resistant liners for lining pipes, pipes lined with stretch-resistant liners, and methods for lining pipes with stretch-resistant liners. The liners are made from a layer of stretch-resistant woven material, which may be a scrim, sandwiched between two layers of non-woven resin-impregnated material to form a laminate structure which is rolled into a tube to provide a liner having concentric sleeves.
    Type: Application
    Filed: May 24, 2002
    Publication date: November 27, 2003
    Applicant: Lantor, Inc.
    Inventors: John S. Williamson, Jin Choi
  • Patent number: 5761823
    Abstract: An inspection tool for verifying the relative planarity of a flat surface or for verifying whether a first planar surface is parallel to a second planar surface is described. The tool includes a dial indicator on the end of a flexible support arm which is rotatably mounted on a base with a planar bottom surface. The flexible support arm permits the dial indicator to be positioned in contact with the planar bottom surface of the base and the axis of rotation is adjustable with respect to the planar bottom surface which allows the device to be self-calibrating. One application of the device is verifying whether the ring carrier or probe card of a wafer prober is parallel with the wafer probe chuck. The planar bottom surface of the base is placed on the wafer probe chuck and the support arm is rotated with the dial indicator in contact with the ring carrier or the probe card. Any deviation in the dial indicator reading indicates that the surfaces are not parallel.
    Type: Grant
    Filed: July 3, 1996
    Date of Patent: June 9, 1998
    Inventors: John S. Williamson, Jr., Terry A. Pea