Patents by Inventor Jon C. Lee

Jon C. Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method using conductive atomic force microscopy to measure contact leakage current
    Patent number: 6930502
    Abstract: A method for measuring current leakage of a contact of a semiconductor device formed on or in a substrate, includes scanning the contact with a probe of a conductive atomic force microscope; applying a DC voltage between the substrate and a conductive tip of the probe; and measuring a value of a current passing through the contact to the substrate, in response to the applied DC voltage.
    Type: Grant
    Filed: December 10, 2003
    Date of Patent: August 16, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Jon C. Lee, Jung-Hsiang Chuang