Abstract: Various examples related to calibration of a scanning device are disclosed. In one example, among others, a system includes a calibration pattern, a sensing device, and a calibration control system to control positioning of the calibration pattern with respect to the sensing device. Tracking sensors of the sensing device capture images of the calibration pattern during calibration of the sensing device. In another example, a method includes determining an estimated pose of the scanning device using an image of a calibration pattern, determining an error between a projected location of an artifact of the calibration pattern and an actual location of the artifact, and adjusting a tracking parameter using the error. In another example, a method includes determining an association between a pixel of an image sensor of a scanning device and a point in scanner space using pixel information corresponding to light reflected by an illuminated calibration pattern.

Abstract: Various examples related to calibration of a scanning device are disclosed. In one example, among others, a calibration cradle includes a calibration pattern positioned within the calibration cradle and recesses to support a scanning device in a fixed position relative to the calibration pattern. In another example, a method includes positioning a scanning device in a calibration cradle, obtaining an image of a calibration pattern with a tracking sensor of the scanning device, determining an estimated pose of the scanning device, and determining an error associated with the calibration pattern using the estimated pose. In another example, a method includes capturing an image of a cone mirror a probe of a scanning device, determining a centroid of the cone mirror image, and determining an error associated with the cone mirror using the centroid.