Patents by Inventor Jon Sandberg

Jon Sandberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120140223
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Application
    Filed: February 14, 2012
    Publication date: June 7, 2012
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: John MITCHELL, Dwight A. SEHLER, Michael WILLIAMSON, David RICE, Jon SANDBERG, Karen R. SANDBERG
  • Patent number: 8174697
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: September 26, 2011
    Date of Patent: May 8, 2012
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
  • Patent number: 8154724
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: April 10, 2012
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Jon Sandberg, Karen R. Sandberg, legal representative
  • Publication number: 20120012757
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Application
    Filed: September 26, 2011
    Publication date: January 19, 2012
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: John MITCHELL, Jon SANDBERG, Karen R. Sandberg, Dwight A. Sehler
  • Patent number: 8027035
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: September 27, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, Legal Representative, Dwight A. Sehler
  • Publication number: 20110155927
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Application
    Filed: March 8, 2011
    Publication date: June 30, 2011
    Applicant: Particle Measuring Systems, Inc.
    Inventors: John MITCHELL, Jon Sandberg, Dwight A. Sehler, Karen R. Sandberg
  • Patent number: 7916293
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: March 29, 2011
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
  • Publication number: 20090244536
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Application
    Filed: December 2, 2008
    Publication date: October 1, 2009
    Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Jon Sandberg, Karen R. Sandberg
  • Publication number: 20090219530
    Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
    Type: Application
    Filed: December 2, 2008
    Publication date: September 3, 2009
    Inventors: John Mitchell, Jon Sandberg, David A. Turner, Dwight A. Sehler