Patents by Inventor Jonathan Doering

Jonathan Doering has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230205663
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Application
    Filed: March 6, 2023
    Publication date: June 29, 2023
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti
  • Patent number: 11609838
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: March 21, 2023
    Assignee: PayPal, Inc.
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti
  • Publication number: 20220129787
    Abstract: There are provided systems and methods for machine learning model verification for assessment pipeline deployment. A service provider may provide AI hosting platforms that allow for clients, customers, and other end users to upload AI models for execution, such as machine learning models. A user may utilize one or more user interfaces to provide model data and files, such as model artifacts, model requirements, and model test data. Thereafter, a model deployer may validate that the AI hosting platform has the required code packages and other model framework requirements for the AI model. The model test data may be used to ensure that the AI model is behaving correctly and providing the correct predictions based on input data and features. If so, the AI model may be deployed in a live production computing environment and used for predictive services.
    Type: Application
    Filed: October 27, 2020
    Publication date: April 28, 2022
    Inventors: Sriharsha Vogeti, Varun Reddy Putta, Jonathan Doering, Charles Poli, Anupam Tarsauliya
  • Publication number: 20220083445
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Application
    Filed: September 17, 2020
    Publication date: March 17, 2022
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti