Patents by Inventor Jonathan E. Ludlow

Jonathan E. Ludlow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7075662
    Abstract: A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system includes a patterned light projector with optical axis disposed at an oblique angle with respect to the plane of the article being inspected, an extended light source, and an image detector disposed above the article to detect the image of the pattern on the article. The light pattern includes lines with a substantially equal thickness and spacing. The spacing of the lines is greater than a spacing or pitch of the specular elements. An image processor, coupled to the image detector, receives the image, locates the lines, and measures the lateral shift of the lines. Height information is determined from the lateral shift and projection angle using triangulation.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: July 11, 2006
    Assignee: Siemens Energy and Automation, Inc.
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Publication number: 20020018219
    Abstract: A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system includes a patterned light projector with optical axis disposed at an oblique angle with respect to the plane of the article being inspected, an extended light source, and an image detector disposed above the article to detect the image of the pattern on the article. The light pattern includes lines with a substantially equal thickness and spacing. The spacing of the lines is greater than a spacing or pitch of the specular elements. An image processor, coupled to the image detector, receives the image, locates the lines, and measures the lateral shift of the lines. Height information is determined from the lateral shift and projection angle using triangulation.
    Type: Application
    Filed: May 16, 2001
    Publication date: February 14, 2002
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 6262803
    Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.
    Type: Grant
    Filed: September 10, 1998
    Date of Patent: July 17, 2001
    Assignee: Acuity Imaging, LLC
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 6144453
    Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.
    Type: Grant
    Filed: October 5, 1999
    Date of Patent: November 7, 2000
    Assignee: Acuity Imaging, LLC
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 4382633
    Abstract: A longwall mining system includes a bidirectional shearer and a roof supporting structure. The shearer includes a pair of angled floor drums, a pivotable roof drum and a loading conveyor. Each drum has a plurality of picks disposed about the drum surface for cutting a material to be mined and a plurality of vanes disposed on the drum surface for carrying the cut material to the loading conveyor. The roof supporting structure includes a load carrying shield which is braced by a pair of supports. The supports are located under the shield in a position between the shearer and a face conveyor. The face conveyor, which is fed by the loading conveyor, carries the mined material to main conveyor for haulage to the outside.
    Type: Grant
    Filed: February 24, 1981
    Date of Patent: May 10, 1983
    Assignee: Foster-Miller Associates, Inc.
    Inventors: Jonathan E. Ludlow, Cecil V. Peake, Paul J. Guay