Patents by Inventor Jonathan P. G. Gavin

Jonathan P. G. Gavin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-contact test system for determining whether electronic device structures contain manufacturing faults
    Patent number: 9372228
    Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
    Type: Grant
    Filed: September 29, 2014
    Date of Patent: June 21, 2016
    Assignee: Apple Inc.
    Inventors: Joshua G. Nickel, Jonathan P. G. Gavin
  • NON-CONTACT TEST SYSTEM
    Publication number: 20150048858
    Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
    Type: Application
    Filed: September 29, 2014
    Publication date: February 19, 2015
    Inventors: Joshua G. Nickel, Jonathan P.G. Gavin
  • Non-contact test system for determining whether electronic device structures contain manufacturing faults
    Patent number: 8847617
    Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
    Type: Grant
    Filed: April 22, 2011
    Date of Patent: September 30, 2014
    Assignee: Apple Inc.
    Inventors: Joshua G. Nickel, Jonathan P. G. Gavin
  • NON-CONTACT TEST SYSTEM
    Publication number: 20120268153
    Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
    Type: Application
    Filed: April 22, 2011
    Publication date: October 25, 2012
    Inventors: Joshua G. Nickel, Jonathan P. G. Gavin