Patents by Inventor Joong-Wuk Kang

Joong-Wuk Kang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Weapon management system using police officer black-box, method and apparatus for police officer black-box
    Patent number: 9773287
    Abstract: Disclosed herein are a weapon management system using a cop's black-box which collects environment information by sensing an aiming movement of a user to a subject according to use of a weapon from a first cop's black-box, and receives, from a plurality of second cop's black-boxes located within a preset radial distance from the user, external environment information based on the aiming movement of the user, a cop's black-box, and a method for the same. Use of the weapon may be monitored in real time using collected environment information and external environment information such that a further action can be taken.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: September 26, 2017
    Assignee: Base Korea Information Communication Co., Ltd.
    Inventors: Ja Min Goo, Ja Cheon Koo, Sun Chan Kweon, Joong Wuk Kang
  • Testing method detecting localized failure on a semiconductor wafer
    Patent number: 7514949
    Abstract: A method and system for testing a wafer comprising semiconductor chips are disclosed. A determination of whether or not the wafer is defective is made in relation to a spatially related group of filtered failed semiconductor chips on the wafer, where the spatially related group corresponds to a localized failure on the wafer and is used to calculate a defect index value.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: April 7, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Joong-Wuk Kang, Kwang-Yung Cheong
  • Testing method detecting localized failure on a semiconductor wafer
    Publication number: 20070035322
    Abstract: A method and system for testing a wafer comprising semiconductor chips are disclosed. A determination of whether or not the wafer is defective is made in relation to a spatially related group of filtered failed semiconductor chips on the wafer, where the spatially related group corresponds to a localized failure on the wafer and is used to calculate a defect index value.
    Type: Application
    Filed: March 13, 2006
    Publication date: February 15, 2007
    Inventors: Joong-Wuk Kang, Kwang-Yung Cheong