Abstract: A horizontal type rotary compressor includes a case including an inlet and an outlet and configured to store oil, a compressor having a compression space in which refrigerant is accommodated, a driver to drive the compressor, a rotating shaft to connect the driver and the compressor, an oil feed pipe disposed at a side of the compressor, a first plate configured to divide the case into a first area for the driver and a second area for the compressor. The first plate including a discharge hole through which compressed refrigerant is discharged from the compressor to the first area. A second plate dividing the case into the second area and a third area in which the oil feed pipe communicates with the outlet, and includes a second hole formed at the upper side to communicate the second and third areas. The first and second plates forming an oil flow path.

Abstract: A hermetic compressor including a casing; a motor inside the casing, and including a rotor and stator; a drive shaft that rotates with the rotor; a compression unit below the motor to compress refrigerant and discharge compressed refrigerant to an inside of the casing; and an oil blocking guide above the motor to rotate with the rotor. The oil blocking guide includes an oil blocking plate formed in a disk shape, an oil guide part extending outward and upward from an edge of the oil blocking plate, and a support part connecting the oil blocking plate to the drive shaft and space the oil blocking plate from the rotor. The oil blocking plate and the oil guide part block upward movement of oil passing through the motor, and guide the oil to an inner circumferential surface of the casing through centrifugal force while the oil blocking guide is rotating.

Abstract: A robot cleaner includes a main body, a traveling unit installed in the main body, to move the main body, an ultrasonic sensor to emit an oscillation wave, to receive a reflection wave reflected from an object surface, and to output vibration generated by the oscillation wave and vibration generated by the reception of the reflection wave as an electrical signal, a waveform analyzer to calculate a generation time period of the electrical signal output from the ultrasonic sensor, and a controller to determine information about the object surface based on the calculated generation time period of the electrical signal, and to control movement of the traveling unit based on the information about the object surface.

Abstract: A robot cleaner includes a main body, a traveling unit installed in the main body, to move the main body, an ultrasonic sensor to emit an oscillation wave, to receive a reflection wave reflected from an object surface, and to output vibration generated by the oscillation wave and vibration generated by the reception of the reflection wave as an electrical signal, a waveform analyzer to calculate a generation time period of the electrical signal output from the ultrasonic sensor, and a controller to determine information about the object surface based on the calculated generation time period of the electrical signal, and to control movement of the traveling unit based on the information about the object surface.

Abstract: A microorganism detection apparatus including a light source unit to irradiate light, a mirror chamber including a light inlet port and a light outlet port, through which the light is introduced and discharged, respectively an inlet port and an outlet port, through which particles are introduced and discharged, respectively, so that light emitted from the particles (emitted particle light) is generated by the light, and an opening, through which the emitted particle light is discharged outside. The mirror chamber has an oval longitudinal section, and is provided at an inside thereof with a mirror. A condensing optical system is disposed in front of the opening outside the opening to condense the emitted particle light discharged through the opening. Condensing efficiency of the fluorescent light condensing optical system is maximized.

Abstract: A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.

Abstract: Provided are a scanning capacitance microscope, which can be very sensitive to a variation of capacitance between a tip and a sample and can make a clear and accurate measurement by preventing stray capacitance, a method of the scanning capacitance microscope, and a recording medium having embodied thereon a program for the method. The scanning capacitance microscope includes: a resonator including a probe having a cantilever and a tip attached to an end of the cantilever, the resonator resonating according to capacitance between the tip of the probe and a sample; an oscillator generating and applying a signal having a variable frequency to the resonator; and a detector detecting a signal generated by the resonator.

Abstract: A mounting mechanism for the probe head of a Scanning Probe Microscope (SPM) includes two dovetail and two right and left threaded pushdown screws, for convenient mounting and clamping of the probe head. After inserting the probe head between the upper and lower dovetails of the z stage, handles of the pushdown screws are turned so that the lower portion of the upper dovetail rail clamp down the probe head. This mounting mechanism using the dovetail rails and pushdown screws ensures rigid mount and convenient use of the probe head at the same time.

Abstract: A mounting mechanism for the probe tip of a Scanning Probe Microscope (SPM) includes a scanner supported by a stationary frame, and a kinematic mechanism supported by the scanner. The kinematic mechanism includes at least three protrusions and at least one magnet. The mounting mechanism for the probe tip also includes a chip mount having a hole, a slot and a flat surface. The chip mount, on being held by the magnet, provides an easy way to mount the probe tip without requiring any tools.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.