Abstract: A method for determining a failure rate of an electrochemical sensor type for a process, wherein the process is defined by determined values, or value intervals, of a plurality of specified process parameters, and wherein a plurality of defect types is specified for the sensor type, comprising steps as follows: assigning, by means of expert knowledge, a defect rate to each combination of one of the values, or value intervals, of the specified process parameters and one of the specified defect types; and calculating the failure rate of the sensor type according to a calculational specification with application of the defect rates assigned to the combinations of a value, or value interval, of a process parameter and a defect type.

Abstract: A method for safe performance of a calibration and/or an adjusting of a measured variable of a measuring device in automation technology, especially in process analysis technology, in the case of which a calibration result or an adjusting value is ascertained and shown on a display. In order to assure reliable adjusting or calibrating of a measured variable of a measuring device, the calibration result or the adjusting value is shown in multiple instances at random locations of the display, wherein, upon agreement of all shown calibration results or adjusting values, a confirmation is effected by a user of the measuring device.

Abstract: A method for determining a failure rate of an electrochemical sensor type for a process, wherein the process is defined by determined values, or value intervals, of a plurality of specified process parameters, and wherein a plurality of defect types is specified for the sensor type, comprising steps as follows: assigning, by means of expert knowledge, a defect rate to each combination of one of the values, or value intervals, of the specified process parameters and one of the specified defect types; and calculating the failure rate of the sensor type according to a calculational specification with application of the defect rates assigned to the combinations of a value, or value interval, of a process parameter and a defect type.

Abstract: The invention concerns a device for processing frequency signals with a power limiter (10), in which the power limiter (10) has a first signal path (12), the power limiter (10) has a second signal path (14), the first signal path (12) has means (16) for analog signal processing, the second signal path (14) has means (18) for digital signal processing, the means (18) for digital signal processing have means for selective suppression of specific frequency regions and an output of the first signal path (12) and an output of the second signal path (14) are connected to means (22) for combination of signals. The invention also concerns a method that can advantageously be executed with the device according to the invention.

Abstract: Method of preparing data, in particular voice signal parameters for transmission at a low bit rate, identical signal parameters are combined interval by interval in quantized form; forfurther bit reduction, bits are suppressed from the total number of bits of at least two intervals, the bit difference to be suppressed being formed on the basis of the total number of unreduced bits with respect to the next-higher power of two; and theprocedure supplies a better voice quality than in the case of changing the number of quantization stages by multiples of 2.

Abstract: The vector encoding method, particularly for voice signals, includes storing autocorrelation coefficients in one codebook and performing a logic operation on the autocorrelation coefficients with an autocorrelation function for the pulse response of an excitation filter to give the energy of the filtered excitation signal. For additional data reduction only those values having three autocorrelation coefficients other than the value 0 are entered in the codebook. The combination patterns which can be formed from these coefficients occur with the same frequency in the codebook. Because of these features, a transmission of encoded data which is very robust with respect to faults is possible with reduced processing and storage effort.