Abstract: An apparatus, system, and method are disclosed for automated device configuration and testing. The present invention teaches receiving and implementing a configuration request form a host, receiving and executing a power cycle request, and receiving and implementing a test request. In certain embodiments, the present invention teaches responding to a target device discovery request, communicating a test execution status, and communication a current operation status request. In certain embodiments, the present invention also teaches accessing configuration data received from the host device or within a local configuration data repository.

Abstract: A trace file collection system for implementing a trace file collection method for a soft error collection of one or more trace files associated with a data processing device. The method involves a periodic retrieval of an error log from the data processing device, a comparison of two or more retrieved error logs, and a retrieval of the trace file(s) from the data processing device based on the comparison of the two or more retrieved error logs indicating an occurrence of one or more soft errors within the data processing device.