Patents by Inventor Josef Fazekas

Josef Fazekas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting the reliability of integrated semiconductor components at high temperatures
    Patent number: 6873170
    Abstract: The invention relates to a device and a method for detecting the reliability of integrated semiconductor components. The device includes a carrier substrate for receiving an integrated semiconductor component that will be examined, a heating element, and a temperature sensor. The temperature sensor has at least a portion of a parasitic functional element of the semiconductor component. As a result, reliability tests can be carried out in a particularly accurate and space-saving manner.
    Type: Grant
    Filed: January 2, 2004
    Date of Patent: March 29, 2005
    Assignee: Infineon Technologies AG
    Inventors: Wilhelm Asam, Josef Fazekas, Andreas Martin, David Smeets, Jochen Von Hagen
  • Device and method for detecting a reliability of integrated semiconductor components at high temperatures
    Patent number: 6787799
    Abstract: The invention relates to a device and a method for detecting the reliability of integrated semiconductor components. The device includes a carrier substrate for receiving an integrated semiconductor component that will be examined, a heating element, and a temperature sensor. The temperature sensor has at least a portion of a parasitic functional element of the semiconductor component. As a result, reliability tests can be carried out in a particularly accurate and space-saving manner.
    Type: Grant
    Filed: July 23, 2002
    Date of Patent: September 7, 2004
    Assignee: Infineon Technologies AG
    Inventors: Wilhelm Asam, Josef Fazekas, Andreas Martin, David Smeets, Jochen Von Hagen
  • Method for detecting the reliability of integrated semiconductor components at high temperatures
    Publication number: 20040140826
    Abstract: The invention relates to a device and a method for detecting the reliability of integrated semiconductor components. The device includes a carrier substrate for receiving an integrated semiconductor component that will be examined, a heating element, and a temperature sensor. The temperature sensor has at least a portion of a parasitic functional element of the semiconductor component. As a result, reliability tests can be carried out in a particularly accurate and space-saving manner.
    Type: Application
    Filed: January 2, 2004
    Publication date: July 22, 2004
    Applicant: Infineon Technologies AG
    Inventors: Wilhelm Asam, Josef Fazekas, Andreas Martin, David Smeets, Jochen Von Hagen
  • Electromigration test structure for detecting the reliability of wiring
    Publication number: 20040036495
    Abstract: An electromigration test structure detects the reliability of wirings. A region to be tested has an electromigration region and an electromigration barrier region formed between first and second test structure terminal regions. In order to estimate a service life in a manner that is highly accurate and suitable for highly accelerated tests, a first and third sensor terminal are situated in direct proximity to the electromigration barrier region, and a second sensor terminal is situated at the second test structure terminal region.
    Type: Application
    Filed: August 25, 2003
    Publication date: February 26, 2004
    Inventors: Josef Fazekas, Andreas Martin, Jochen Von Hagen
  • Device and method for detecting a reliability of integrated semiconductor components at high temperatures
    Publication number: 20030020131
    Abstract: The invention relates to a device and a method for detecting the reliability of integrated semiconductor components. The device includes a carrier substrate for receiving an integrated semiconductor component that will be examined, a heating element, and a temperature sensor. The temperature sensor has at least a portion of a parasitic functional element of the semiconductor component. As a result, reliability tests can be carried out in a particularly accurate and space-saving manner.
    Type: Application
    Filed: July 23, 2002
    Publication date: January 30, 2003
    Inventors: Wilhelm Asam, Josef Fazekas, Andreas Martin, David Smeets, Jochen Von Hagen
  • Semiconductor device, semiconductor test structure and method for fabricating a semiconductor device
    Publication number: 20030006412
    Abstract: An insulation region comprising a dielectric is applied to an electrically active region, and then an electrically conductive region which is connected to an electrically conductive supply conductor is applied to the insulation region. An auxiliary conductor track, which is connected to a region which is highly doped at least with doping atoms of a first conductivity type, is arranged adjacent to the electrically conductive supply conductor.
    Type: Application
    Filed: July 5, 2001
    Publication date: January 9, 2003
    Inventors: Andreas Martin, Josef Fazekas
  • Gasket impregnated with a polymerizable liquid and method for its manufacture
    Patent number: 4201804
    Abstract: A gasket made of a fibrous and/or porous material is impregnated with a liquid saturating agent consisting essentially of an organic, synthetic and completely polymerizable liquid that does not contain agents which will evaporate during polymerization of the liquid.
    Type: Grant
    Filed: June 26, 1978
    Date of Patent: May 6, 1980
    Assignee: Goetzewerke Friedrich Goetze AG
    Inventors: Friedhelm Stecher, Josef Fazekas, Paul Johren, Martin Morsbach
  • Cylinder head gasket for internal-combustion engine
    Patent number: 3970322
    Abstract: A cylinder head gasket for internal combustion engines comprises at least one layer of a soft material having pores which are enriched with an impregnating agent and edges which are bordered by a casing. The pores of the soft material underneath the flange are kept free of impregnating agent.
    Type: Grant
    Filed: January 31, 1974
    Date of Patent: July 20, 1976
    Assignee: Goetzewerke-Friedrich Goetze AG
    Inventors: Friedhelm Stecher, Josef Fazekas, Paul Johren, Martin Morsbach