Abstract: Described embodiments relate to a method of testing fully buffered memory modules that involves placing a buffer device, a test vectors generator, and a switch into a memory device tester, coupling the buffer device and the test vectors generator to the switch inside the tester, coupling the switch to an identical buffer device that is located on a memory module with plurality of DRAM devices, and testing the plurality of DRAM devices and the buffer device of the memory module. An apparatus implementing the method comprises a memory device tester, a memory bus, and a plurality of memory modules under test, the tester and the plurality of memory modules connected to the memory bus in a point-to-point manner, the tester comprising a buffer device, a test vectors generator, and a switch, the tester connected to the memory bus through the switch, each memory module under test having a plurality of DRAM devices and an identical buffer device.

Abstract: A distributed tester method and system communicates test recipes for testing electronic devices from a host computer over a network to a test site. The test site translates test recipes into test instructions for execution by a test engine that determines the status of the electronic device. For instance, in a tester for testing memory, a test recipe is defined and stored with a host computer to determine test data for storage on the memory device under test at the test site. The host computer controls execution of the test recipe over the network. The test recipe is defined and stored in an XML formatted data file transmitted over the network to a processor at the test site. The test site processor translates the XML formatted data into test instructions for execution by a test engine. The test engine determines whether the memory device under test accurately stores data and provides the results, such as erroneously stored data, to the host computer through the network.

Abstract: A distributed tester method and system communicates test recipes for testing electronic devices from a host computer over a network to a test site. The test site translates test recipes into test instructions for execution by a test engine that determines the status of the electronic device. For instance, in a tester for testing memory, a test recipe is defined and stored with a host computer to determine test data for storage on the memory device under test at the test site. The host computer controls execution of the test recipe over the network. The test recipe is defined and stored in an XML formatted data file transmitted over the network to a processor at the test site. The test site processor translates the XML formatted data into test instructions for execution by a test engine. The test engine determines whether the memory device under test accurately stores data and provides the results, such as erroneously stored data, to the host computer through the network.