Patents by Inventor Joshua B. Shaffer

Joshua B. Shaffer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10268182
    Abstract: A computer-implemented process is disclosed for securely transmitting a three-dimensional part file, e.g., to a parts manufacturer or storage location. A method is also provided for creating a three-dimensional part capable of integrity validation is provided. Also, a method is provided, for validating the integrity of a three-dimensional part in an additive manufacturing. Yet further, a method is provided for qualifying a part created by additive manufacturing. Moreover, systems are provided for carrying out one or more of the above.
    Type: Grant
    Filed: September 28, 2017
    Date of Patent: April 23, 2019
    Assignee: MRL MATERIALS RESOURCES LLC
    Inventors: Ayman A. Salem, Daniel P. Satko, Joshua B. Shaffer
  • Publication number: 20180088559
    Abstract: A computer-implemented process is disclosed for securely transmitting a three-dimensional part file, e.g., to a parts manufacturer or storage location. A method is also provided for creating a three-dimensional part capable of integrity validation is provided. Also, a method is provided, for validating the integrity of a three-dimensional part in an additive manufacturing. Yet further, a method is provided for qualifying a part created by additive manufacturing. Moreover, systems are provided for carrying out one or more of the above.
    Type: Application
    Filed: September 28, 2017
    Publication date: March 29, 2018
    Inventors: Ayman A. Salem, Daniel P. Satko, Joshua B. Shaffer
  • Patent number: 9557299
    Abstract: According to aspects of the present disclosure, features of interest in materials are analyzed. The method comprises capturing a morphology of the feature of interest on a surface or an interior of a material under evaluation. The method also comprises selecting targeted spatial locations on the surface or the interior of the material under evaluation based upon the captured morphology. Also, the method comprises capturing information about the local state (e.g., crystallographic orientation) of the surface or the interior of the sample at the selected targeted spatial locations. Still further, the method comprises using the captured local state information to fill in the non-targeted spatial locations in the material corresponding to the captured morphology and or topology.
    Type: Grant
    Filed: March 13, 2014
    Date of Patent: January 31, 2017
    Assignee: MRL MATERIALS RESOURCES LLC
    Inventors: Ayman A. Salem, Daniel P. Satko, Joshua B. Shaffer
  • Patent number: 9070203
    Abstract: The identification and quantification of microtextured regions in orientation datasets is provided through the use of microstructure informatics based on n-point correlation functions, dimensionality reduction techniques, and a computer algebra system. Orientation information is extracted for materials and processing is performed on the orientation information along with other ancillary data that accompanies each piece of orientation information and a hybrid descriptor of orientation is formed. Representative descriptors are identified such that regions of microtexture are classified. This classification is mapped back onto the real space of the sample and a local clustering is done to identify continuous regions of microtexture. These labeled continuous regions of microtexture then provide a method for segmentation of the orientation data into their respective macrozones.
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: June 30, 2015
    Assignee: MRL MATERIALS RESOURCES LLC
    Inventors: Ayman A. Salem, Joshua B. Shaffer
  • Publication number: 20140260623
    Abstract: According to aspects of the present disclosure, features of interest in materials are analyzed. The method comprises capturing a morphology of the feature of interest on a surface or an interior of a material under evaluation. The method also comprises selecting targeted spatial locations on the surface or the interior of the material under evaluation based upon the captured morphology. Also, the method comprises capturing information about the local state (e.g., crystallographic orientation) of the surface or the interior of the sample at the selected targeted spatial locations. Still further, the method comprises using the captured local state information to fill in the non-targeted spatial locations in the material corresponding to the captured morphology and or topology.
    Type: Application
    Filed: March 13, 2014
    Publication date: September 18, 2014
    Applicant: MRL Materials Resources LLC
    Inventors: Ayman A. Salem, Daniel P. Satko, Joshua B. Shaffer