Abstract: A multi-port phase shifter includes a ground, a first line on one surface of the ground, a second line on the other surface of the ground, a third line spaced at a predetermined distance from the upper surface of the first line and facing a part of the first line, and a fourth line spaced at a predetermined distance from the upper surface of the second line and facing a part of the second line. A via hole penetrates the ground. A power supply line on the one surface of the ground includes a region having the via hole. Multiple ports make the phase shifter applicable to a sector antenna for obtaining a high gain. Phase shifter volume can be reduced by implementing multiple ports in one phase shifter without coupling two or more phase shifters, thereby eliminating an additional component such as a fixing pole or a connecting pole.

Abstract: A multi-port phase shifter includes a ground, a first line on one surface of the ground, a second line on the other surface of the ground, a third line spaced at a predetermined distance from the upper surface of the first line and facing a part of the first line, and a fourth line spaced at a predetermined distance from the upper surface of the second line and facing a part of the second line. A via hole penetrates the ground. A power supply line on the one surface of the ground includes a region having the via hole. Multiple ports make the phase shifter applicable to a sector antenna for obtaining a high gain. Phase shifter volume can be reduced by implementing multiple ports in one phase shifter without coupling two or more phase shifters, thereby eliminating an additional component such as a fixing pole or a connecting pole.

Abstract: An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.

Abstract: An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.