Abstract: A method of introducing a sample into an atomic spectrometer utilizes a spray head including a vibratable mesh. A liquid sample is conducted to one face of the mesh and the mesh is vibrated to expel sample droplets from the other face of the mesh into the proximal end of a flow passage axially spaced from the mesh. Also, a low pressure gas as flowed into the proximal end of the flow passage to mix with the droplets to form an aerosol in the flow passage. The vibrating of the mesh is controlled to provide in the aerosol a selected total volume of monodisperse droplets while the flow of the carrier gas is independently controlled to provide a selected rate of flow of the aerosol along the flow passage thereby to optimize consumption of the sample. Apparatus for practicing the method is also disclosed.

Abstract: A photonic measurement system, such as an atomic absorption spectrometer, includes source, sample and detection modules that are interconnected by fiber optic cables. A first set of fiber optic cables guides light from one or more light sources in the source module to each of at least two analysis chambers in the sample module. A second set of fiber optic cables guides light from the analysis chambers to a detector in the detection module. The detector provides to a processing sub-system signals that correspond to intensities of the guided light. One analysis chamber is selected to perform a sample analysis at a given time, and the processing sub-system processes the signals associated with the selected analysis chamber as measurement signals. The processing sub-system may further process the signals associated with a given non-selected analysis chamber as reference signals.

Abstract: A method of introducing a sample into an atomic spectrometer utilizes a spray head including a vibratable mesh. A liquid sample is conducted to one face of the mesh and the mesh is vibrated to expel sample droplets from the other face of the mesh into the proximal end of a flow passage axially spaced from the mesh. Also, a low pressure gas as flowed into the proximal end of the flow passage to mix with the droplets to form an aerosol in the flow passage. The vibrating of the mesh is controlled to provide in the aerosol a selected total volume of monodisperse droplets while the flow of the carrier gas is independently controlled to provide a selected rate of flow of the aerosol along the flow passage thereby to optimize consumption of the sample. Apparatus for practicing the method is also disclosed.

Abstract: A photonic measurement system, such as an atomic absorption spectrometer, includes source, sample and detection modules that are interconnected by fiber optic cables. A first set of fiber optic cables guides light from one or more light sources in the source module to each of at least two analysis chambers in the sample module. A second set of fiber optic cables guides light from the analysis chambers to a detector in the detection module. The detector provides to a processing sub-system signals that correspond to intensities of the guided light. One analysis chamber is selected to perform a sample analysis at a given time, and the processing sub-system processes the signals associated with the selected analysis chamber as measurement signals. The processing sub-system may further process the signals associated with a given non-selected analysis chamber as reference signals.

Abstract: A system and method are provided for securely manufacturing a device at a foundry. For example, an integrated circuit chip may be securely fabricated at an untrusted foundry by later verifying authenticity of the integrated circuit chip based on a valid usage of an original source code file associated with a semiconductor manufacturing process of the integrated circuit chip. The integrated circuit chip may be authenticated by matching a first set of unique daughter codes generated during fabrication with a second set of unique daughter codes generated independently by some entity other than the foundry. In this way, a trusted electronics integrator may compare the first and second unique daughter codes to nondestructively determine whether the integrated circuit chip is a trusted device or a tampered device.

Abstract: Disclosed is a spectrometer system with unique wavelength resolution improving relative positioning of diffraction grating and detector. Also disclosed is a modified evolving windowed factor analysis based method of detecting semiconductor etch end points which is particularly well suited for use in real time monitoring and process control. Use of wavelength group selecting mask filters is also disclosed.

Abstract: A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray.