Patents by Inventor Juichi Nakada

Juichi Nakada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8185328
    Abstract: Differences in outputs from multiple terminals are easily measured.
    Type: Grant
    Filed: February 15, 2007
    Date of Patent: May 22, 2012
    Assignee: Advantest Corporation
    Inventor: Juichi Nakada
  • Publication number: 20090055109
    Abstract: Differences in outputs from multiple terminals are easily measured.
    Type: Application
    Filed: February 15, 2007
    Publication date: February 26, 2009
    Applicant: ADVANTEST CORPORATION
    Inventor: Juichi Nakada
  • Patent number: 7466141
    Abstract: A phase measurement device measures an output of an amplifier when an input signal having input frequency components is fed to the amplifier, and includes multipliers for orthogonally transforming the output of the amplifier a phase acquisition section for acquiring phases ?1 and ?2 of the input frequency components in the output of the multipliers, and ?3 and ?4 (third distortion), and ?5 and ?6 (fifth distortion) of the distortion components, a match time/phase measurement section for measuring a match time point ?t when ?1 and ?2 match each other and a distortion component phase measurement section for measuring phases ?3 to ?6 at the match time point ?t. The phase acquisition section acquires at least one of ?1 and ?2, and ?3 and ?5 (with the frequencies higher than those of ?1 and ?2) or ?4 and ?6 (with the frequencies lower than those of ?1 and ?2).
    Type: Grant
    Filed: January 19, 2005
    Date of Patent: December 16, 2008
    Assignee: Advantest Corporation
    Inventors: Makoto Kurosawa, Juichi Nakada
  • Patent number: 7379851
    Abstract: A signal power coefficient and a noise power coefficient are calculated for each channel, using parameters which have been optimized up to a small error value by an optimizing means, then using the thus-calculated signal power coefficient and noise power coefficient, there are determined a signal power and a noise power for each channel, and the signal power and the noise power thus determined are displayed on one and same display screen channel by channel.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: May 27, 2008
    Assignee: Advantest Corporation
    Inventors: Satoshi Koizumi, Juichi Nakada, Hideki Ichikawa, Eiji Nishino
  • Patent number: 7352713
    Abstract: A multiplexed signal quality display system, method, and program, and recorded medium where the program is recorded. The invention measures the quality of a multiplexed signal from a communication device wherein a band width to be used and the number of communication channels capable of being accommodated are determined by a diffusion code length, and channels to be used having the number of communication channels, which are determined by a diffusion code length, are decided in terms of a diffusion code number affixed to the type of the diffusion code, to effect communication while ensuring multi-channel communication lines in one and same band.
    Type: Grant
    Filed: June 8, 2002
    Date of Patent: April 1, 2008
    Assignee: Advantest Corporation
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Patent number: 7323883
    Abstract: When a signal having two or more frequency components is fed to a circuit to be measured, a phase of the signal output from the circuit to be measured is measured. A phase measurement device measures an output when an input signal having two input frequency components ?10 and ?20 is fed to an amplifier (circuit to be measured). The phase measurement device includes an orthogonal converter that subjects the output of the amplifier to an orthogonal conversion using an average frequency ?0, which is an average of ?10 and ?20. A phase acquisitioner acquires phases ?1 and ?2 of the input frequency components in the output of the orthogonal converter and a phase ?3 of a distortion component. A match time/phase measurer measures a match time ?t during which phase ?1 is matched with phase ?2, and measures phase ?1 (?t) during that time. A distortion component phase measurer measures phase ?3 (?t) of the distortion component in the match time ?t. A display then displays ?1 (?t) and ?3 (?t).
    Type: Grant
    Filed: May 19, 2004
    Date of Patent: January 29, 2008
    Assignee: Advantest Corporation
    Inventor: Juichi Nakada
  • Publication number: 20080018322
    Abstract: The phases of distortions of a signal outputted from an amplifier are measured. A phase measurement device measures an output of an amplifier when an input signal having input frequency components ?10 and ?20 is fed to the amplifier. The phase measurement device includes multipliers for orthogonally transforming the output of the amplifier by means of ?c, a phase acquisition section for acquiring phases ?1 and ?2 of the input frequency components ?10 and ?20 in the output of the multipliers, and ?3 and ?4 (third distortion), and ?5 and ?6 (fifth distortion) of the distortion components, a match time/phase measurement section for measuring a match time point ?t when ?1 and ?2 match each other according to the acquisition result of the phase acquisition section, and a distortion component phase measurement section for measuring phases ?3 to ?6 of the distortion components at the match time point ?t according to the acquisition result of the phase acquisition section.
    Type: Application
    Filed: January 19, 2005
    Publication date: January 24, 2008
    Applicant: ADVANTEST CORPORATION
    Inventors: Makoto Kurosawa, Juichi Nakada
  • Publication number: 20070069766
    Abstract: When a signal having two or more frequency components is fed to a circuit to be measured, a phase of the signal output from the circuit to be measured is measured. A phase measurement device measures an output when an input signal having two input frequency components ?10 and ?20 is fed to an amplifier (circuit to be measured). The phase measurement device includes an orthogonal converter that subjects the output of the amplifier to an orthogonal conversion using an average frequency ?0, which is an average of ?10 and ?20. A phase acquisitioner acquires phases ?1 and ?2 of the input frequency components in the output of the orthogonal converter and a phase ?3 of a distortion component. A match time/phase measurer measures a match time ?t during which phase ?1 is matched with phase ?2, and measures phase ?1 (?t) during that time. A distortion component phase measurer measures phase ?3 (?t) of the distortion component in the match time ?t. A display then displays ?1 (?t) and ?3 (?t).
    Type: Application
    Filed: May 19, 2004
    Publication date: March 29, 2007
    Applicant: ADVANTEST CORPORATION
    Inventor: Juichi Nakada
  • Patent number: 7162396
    Abstract: A measurement data displaying device includes a measurement data recording unit and charge displaying unit. The measurement data recording unit records a measurement subject channel, a spreading code length corresponding to the measurement subject channel and measurement data which is a code domain power or noise component power of the measurement subject channel. The chart displaying unit displays a chart having a constant width, and represents the measurement data in a display area whose position is determined by the measurement subject channel and the spreading code length, and which has a width corresponding to the spreading code length.
    Type: Grant
    Filed: July 4, 2002
    Date of Patent: January 9, 2007
    Assignee: Advantest Corporation
    Inventors: Juichi Nakada, Eiji Nishino
  • Publication number: 20060276156
    Abstract: A multipath simulation is simply carried out. There is provided an FIR filter 16 that receives a digital I signal (Q signal), and outputs a digital I? signal (Q? signal), a filter coefficient generating section 14 that generates a filter coefficient used in the FIR filter 16 based upon a sampling frequency fsamp, an RF modulation angular frequency ?, a path delay period ?m, and a size of a path ?m, an I? signal D/A converter 22I (Q? signal D/A converter 22Q) that converts the digital I? signal (digital Q? signal) into an analog I? signal (analog Q? signal) at a sampling frequency fsamp, an I? signal multiplier 28I that multiplies the analog I? signal by an RF signal with the RF modulation angular frequency ?, a Q? signal multiplier 28Q that multiplies the analog Q? signal by an orthogonal RF signal with the same frequency as the RF signal, and orthogonal in phase to the RF signal, and an adder 32 that adds an output from the I? signal multiplier 28I to an output from the Q? signal multiplier.
    Type: Application
    Filed: July 15, 2005
    Publication date: December 7, 2006
    Applicant: Advantest Corporation
    Inventors: Juichi Nakada, Satoshi Utsumi
  • Patent number: 7013243
    Abstract: Since a multiplexed signal quality display system according to the present invention is provided with a memory means which stores measurement results obtained by measuring electric powers of signals present in all of channels within a band used and a display means which specifies a channel where the presence of a signal is predicted and which reads and displays the measured value of the specified channel, it is possible to display the waveform quality of a channel which is determined by desired Walsh code and Walsh code length.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: March 14, 2006
    Assignee: Advantest Corporation
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Publication number: 20040243357
    Abstract: Code domain powers in a plurality of kinds of code layers are simultaneously displayed. Display areas (312a, 312b, 312e, 312h, 312i, 312j) have widths corresponding to spreading code lengths W16, W8, W4 and are colored. Therefore even if measurement data such as the code domain powers in the code layer of plural kinds are simultaneously display on a bar chart, the code layers of the code domain powers can be distinguished.
    Type: Application
    Filed: July 20, 2004
    Publication date: December 2, 2004
    Inventors: Juichi Nakada, Eiji Nishino
  • Publication number: 20040039763
    Abstract: A signal power coefficient and a noise power coefficient are calculated for each channel, using parameters which have been optimized a small error value by an optimizing means, then using the thus-calculated signal power coefficient and noise power coefficient, there are mined a signal power and a noise power for each channel, and the power and the noise power thus determined are displayed on one and display screen channel by channel.
    Type: Application
    Filed: April 15, 2003
    Publication date: February 26, 2004
    Inventors: Satoshi Koizumi, Juichi Nakada, Hideki Ichikawa, Eiji Nishino
  • Publication number: 20040022182
    Abstract: Since a multiplexed signal quality display system according to the present invention is provided with a memory means which stores measurement results obtained by measuring electric powers of signals present in all of channels within a band used and a display means which specifies a channel where the presence of a signal is predicted and which reads and displays the measured value of the specified channel, it is possible to display the waveform quality of a channel which is determined by desired Walsh code and Walsh code length.
    Type: Application
    Filed: August 15, 2003
    Publication date: February 5, 2004
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Publication number: 20040004953
    Abstract: Display areas (W4, W8, W16, W32, W64, W128) have widths corresponding to the band widths determined according to the Walsh lengths and have heights representing the powers. Therefore, which display area corresponds to which Walsh length is known even though the powers of the measurement object channels having different Walsh lengths are combined and the result is displayed. The display areas are arranged in the Paley order, and therefore the display areas do not overlap with one another.
    Type: Application
    Filed: July 3, 2003
    Publication date: January 8, 2004
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Patent number: 6552995
    Abstract: According to the present invention, the inputted spectrum diffusion signal is orthogonal-transformed (16), and then, the common mode output Zre and the orthogonal mode output Zim are respectively AD-transformed (23, 24). Zre and Zim are respectively inputted to series connections of delay units respectively having a sampling period, and the corresponding delayed outputs are complex-multiplied (20i). Each output is N-points-complex-Fast-Fourier-transformed, and the absolute value of the each coefficient is squared. The squared absolute value is two-dimensionally displayed by setting a horizontal axis as a frequency axis and a longitudinal axis as a time axis (32). Then, a carrier wave frequency error is obtained from the maximum peak of the frequency, and a timing phase is obtained from the time.
    Type: Grant
    Filed: February 18, 1999
    Date of Patent: April 22, 2003
    Assignee: Advantest Corporation
    Inventor: Juichi Nakada
  • Patent number: 6545626
    Abstract: An input delay correcting system for an interleave type A/D converter is to be provided. Even if sampling clock signals fed to A/D converters 22 and 24 are not exactly shifted a half cycle from each other, a digital signal outputted from an output terminal 30d of an FIR filter 30 becomes a pulse of a tuning exactly shifted a half cycle from the sampling clock signal fed to the A/D converter 22. A digital signal outputted from, an output terminal 30c of the FIR filter 30 corresponds to a signal resulting from delaying an output of the A/D converter 22 by an integer multiple of the sampling clock signal cycle. Therefore, if the outputs from the output terminals 30c and 30d of the FIR filter 30 are made alternate by a multiplexer 40, the outputs of the A/D converters 22 and 24 can be exactly shifted a half cycle with respect to the sampling clock signals fed thereto.
    Type: Grant
    Filed: September 25, 2001
    Date of Patent: April 8, 2003
    Assignee: Advantest Corporation
    Inventor: Juichi Nakada
  • Publication number: 20030058144
    Abstract: An input delay correcting system for an interleave type A/D converter is to be provided.
    Type: Application
    Filed: September 25, 2001
    Publication date: March 27, 2003
    Applicant: ADVANTEST CORPORATION
    Inventor: Juichi Nakada
  • Publication number: 20020008506
    Abstract: An electric power measuring system and method of simple configuration capable of measuring electric power in correspondence to an arbitrary frequency are provided. The QPSK signal is inputted to the spectrum analyzer. The frequency converter converts the QPSK signal into the IF signal. The A/D converter 16 converts the inputted IF signal into the digital data after the band pass filter removes an aliasing component contained in the IF signal. In the electric power calculating device, FIR filters perform a band limiting process, wherein the digital data is passed through the predetermined receiving filter, and extracting process of extracting an in-phase component I or an orthogonal component Q. The square operation devices square I or Q. The adder 25 adds I2 to Q2. Therefore, the electric power is calculated.
    Type: Application
    Filed: November 8, 1999
    Publication date: January 24, 2002
    Inventors: JUICHI NAKADA, SATOSHI KOIZUMI
  • Patent number: 6104983
    Abstract: The present invention offers a method and apparatus for measuring the waveform quality of a CDMA signal with increased accuracy. A baseband digital measuring signal Z(k) from a quadrature transform/complementary filter 22 is applied to a demodulating part 25, wherein it is demodulated by a PN code of a pilot signal to detect a bit train and an amplitude a'.sub.i. An ideal signal R.sub.i is generated from the bit train, the amplitude a'.sub.i and the PN code. At the same time, auxiliary data A, B, C, H and I, which are used to solve approximate simultaneous equations for computing parameters that minimize the square of the difference between the ideal signal R.sub.i and the measuring signal Z(k), are generated in an ideal signal/auxiliary data generating part 26. The thus obtained auxiliary data and the measuring signal Z(k) are used to solve the simultaneous equations to estimate the parameters in a parameter estimating part 27.
    Type: Grant
    Filed: December 8, 1997
    Date of Patent: August 15, 2000
    Assignee: Advantest Corporation
    Inventor: Juichi Nakada