Patents by Inventor Julien Mekki

Julien Mekki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240168177
    Abstract: This relates to a dosimeter including a light source capable of generating a light beam, an optical coupler-splitter, a radio-sensitive optical fiber, a first photodetector arranged to record a power measurement of the light beam transmitted through the radio-sensitive optical fiber, a reference optical arm, a second photodetector arranged to record a reference power measurement of the light beam transmitted through the reference optical arm, and an electronic system configured to extract a differential radiation induced attenuation measurement in the radio-sensitive optical fiber with respect to the reference optical arm. The light beam is non-polarized or depolarized, or, respectively, the light beam is polarized and the radio-sensitive optical fiber is a polarization-maintaining fiber.
    Type: Application
    Filed: November 17, 2023
    Publication date: May 23, 2024
    Inventors: Pierrick CHEINEY, Thierry ROBIN, Gilles MELIN, Nicolas BALCON, Julien MEKKI, Sylvain GIRARD
  • Patent number: 8981308
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Grant
    Filed: January 31, 2012
    Date of Patent: March 17, 2015
    Assignee: Universite Montpellier 2 Sciences et Techniques
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille
  • Publication number: 20140034841
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Application
    Filed: January 31, 2012
    Publication date: February 6, 2014
    Applicant: UNIVERSITE MONTPELLIER 2 SCIENCES ET TECHNIQUES
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille