Patents by Inventor Juliette P.M. van der Meer

Juliette P.M. van der Meer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray fluorescence apparatus for contamination monitoring
    Patent number: 10634628
    Abstract: An apparatus for X-ray measurement, includes an X-ray source, an X-ray detector, an optical inclinometer, and a processor. The X-ray source is configured to generate and direct an X-ray beam to be incident at a grazing angle on a surface of a sample. The X-ray detector is configured to measure X-ray fluorescence emitted from the surface of the sample in response to being excited by the X-ray beam. The optical inclinometer is configured to measure an inclination of the surface of the sample. The processor is configured to calibrate the grazing angle of the X-ray beam based on the measured inclination, and to further fine-tune the grazing angle based on the X-ray fluorescence measured by the X-ray detector.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: April 28, 2020
    Assignee: BRUKER TECHNOLOGIES LTD.
    Inventors: Nikolai Kasper, Juliette P. M. van der Meer, Elad Yaacov Schwarcz, Matthew Wormington
  • X-Ray Fluorescence Apparatus for Contamination Monitoring
    Publication number: 20180348151
    Abstract: An apparatus for X-ray measurement, includes an X-ray source, an X-ray detector, an optical inclinometer, and a processor. The X-ray source is configured to generate and direct an X-ray beam to be incident at a grazing angle on a surface of a sample. The X-ray detector is configured to measure X-ray fluorescence emitted from the surface of the sample in response to being excited by the X-ray beam. The optical inclinometer is configured to measure an inclination of the surface of the sample. The processor is configured to calibrate the grazing angle of the X-ray beam based on the measured inclination, and to further fine-tune the grazing angle based on the X-ray fluorescence measured by the X-ray detector.
    Type: Application
    Filed: May 31, 2018
    Publication date: December 6, 2018
    Inventors: Nikolai Kasper, Juliette P.M. van der Meer, Elad Yaacov Schwarcz, Matthew Wormington