Patents by Inventor Jun Koshobu

Jun Koshobu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230333006
    Abstract: A circular dichroism measurement apparatus includes a laser light source (QCL) capable of sweeping a wavenumber of a laser light in an infrared wavenumber range containing at least one peak of the sample; a sample chamber where the sample is disposed; a photoelastic modulator that modulates a polarization state of the laser light before or after the laser light of a specific wavenumber in a wavenumber sweep transmits the sample; a detector that detects a variation in intensity of the laser light which transmitted the sample and of which its polarization state is modulated; and a signal processing device that extracts an alternating-current component (AC) that synchronize with a modulation frequency and a direct-current component (DC) from a detected signal of the detector, and calculates a value of infrared circular dichroism of the sample based on a ratio (AC/DC) of the AC and DC.
    Type: Application
    Filed: September 28, 2020
    Publication date: October 19, 2023
    Applicant: JASCO CORPORATION
    Inventors: Masaru SHIMIZU, Jun KOSHOBU
  • Publication number: 20200041408
    Abstract: The present invention provides a total reflection prism that can be used in multiple reflection method and that can make the contact area with the sample small. A total reflection prism is made of a plate-shaped optical member, has a leading-in part and a leading-out part of a measurement light provided at positions deviated from the center of either of the front and back surfaces, and has a plurality of plane parts that are formed perpendicularly to the front and back surfaces respectively on an outer periphery of the prism excluding the front and back surfaces of the prism. The leading-in part is provided to irradiate the measurement light that is guided inside at an angle of incidence of total reflection toward either of the front and back surfaces. The front and back surfaces are provided so that the measurement light travels while totally reflected alternately.
    Type: Application
    Filed: April 11, 2018
    Publication date: February 6, 2020
    Applicant: JASCO CORPORATION
    Inventors: Jun KOSHOBU, Noriaki SOGA, Hiroshi SUGIYAMA
  • Patent number: 10527545
    Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1).
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: January 7, 2020
    Assignee: JASCO Corporation
    Inventors: Noriaki Soga, Hiroshi Sugiyama, Jun Koshobu
  • Patent number: 10393656
    Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.
    Type: Grant
    Filed: March 23, 2017
    Date of Patent: August 27, 2019
    Assignee: JASCO CORPORATION
    Inventors: Noriaki Soga, Tetsuji Sunami, Tsubasa Asatsuma, Hiroshi Sugiyama, Jun Koshobu
  • Patent number: 10317283
    Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: June 11, 2019
    Assignee: JASCO CORPORATION
    Inventors: Tetsuji Sunami, Takashi Shimamura, Norio Wakimoto, Jun Koshobu
  • Publication number: 20190086332
    Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.
    Type: Application
    Filed: March 23, 2017
    Publication date: March 21, 2019
    Applicant: JASCO CORPORATION
    Inventors: Noriaki SOGA, Tetsuji SUNAMI, Tsubasa ASATSUMA, Hiroshi SUGIYAMA, Jun KOSHOBU
  • Patent number: 10234665
    Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light.
    Type: Grant
    Filed: April 17, 2018
    Date of Patent: March 19, 2019
    Assignee: JASCO Corporation
    Inventors: Kento Aizawa, Hiroshi Sugiyama, Jun Koshobu
  • Publication number: 20190041268
    Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength ?1 of a semi-conductor laser, and a step of interpolating intensity signals (I1?, I2?, . . . ) that would be obtained when the interference wave is sampled at positions (D1?, D2?, . . . ) of the movable mirror set on the basis of a wavelength ?0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1?, I2?, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength ?0.
    Type: Application
    Filed: February 2, 2017
    Publication date: February 7, 2019
    Applicant: JASCO CORPORATION
    Inventors: Tetsuji SUNAMI, Takashi SHIMAMURA, Norio WAKIMOTO, Jun KOSHOBU
  • Publication number: 20180335382
    Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1).
    Type: Application
    Filed: May 17, 2018
    Publication date: November 22, 2018
    Inventors: Noriaki SOGA, Hiroshi SUGIYAMA, Jun KOSHOBU
  • Publication number: 20180307018
    Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light.
    Type: Application
    Filed: April 17, 2018
    Publication date: October 25, 2018
    Inventors: Kento AIZAWA, Hiroshi SUGIYAMA, Jun KOSHOBU
  • Patent number: 8797533
    Abstract: A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.
    Type: Grant
    Filed: December 27, 2012
    Date of Patent: August 5, 2014
    Assignee: JASCO Corporation
    Inventors: Tetsuji Sunami, Keisuke Watanabe, Jun Koshobu