Abstract: Methods and apparatuses for measuring and controlling the edge positions of a vapor deposited film, and the positions and widths of vapor deposited zones and margin zones of the film, and also the positions of heavy edges, if any, without requiring a skilled operator, are provided. A vapor deposited film on which vapor deposited zones and margin zones are formed in stripes in the longitudinal direction and alternately in the transversal directly by a margin forming device and a metal evaporator is carried by a film carrier system, while being illuminating with the light emitted from a light source, and the light transmittance distribution of the film in the transversal direction of the film is detected by a line sensor camera, to be used for measuring the edge positions of the film, and the positions and widths of the vapor deposited zones and the margin zones, and also the positions of the heavy edges, and for controlling the margin forming device, the metal evaporator, etc.

Abstract: The thermal shrinkage properties of yarn are measured by applying heat treatment to the yarn while it travels through a straight yarn path formed between a feed roller and a draw roller. The peripheral speed of the feed roller is set at a desired constant peripheral speed V.sub.1. The tension T of the yarn is detected at the downstream of the feed roller, and the peripheral speed of the draw roller is controlled at a speed V.sub.2 so that the detected tension T becomes equal to a desired preset tension T.sub.0 of the yarn. The thermal shrinkage S(%) is measured through the computation of S=[(V.sub.1 -V.sub.2)/V.sub.1 ].times.100. If the controlling of the peripheral speed V.sub.2 of the draw roller is effected so that V.sub.2 /V.sub.1 =a desired constant value, the detected tension of the yarn can be used for measuring the thermal shrinkage stress of the measured yarn.