Abstract: Disclosed is an antibacterial flexible cover window formed using an antibacterial coating composition containing antibacterial nanoparticles dispersed in a resin coating solution. In the antibacterial coating composition, 0.001 to 0.5 parts by weight of the antibacterial nanoparticles are dispersed in 100 parts by weight of the resin coating solution. The antibacterial flexible cover window includes an antibacterial layer that is formed by applying the antibacterial coating composition to a glass substrate. Therefore, the antibacterial flexible cover window exhibits a good and long-lasting antibacterial activity.

Abstract: A method of creating a privacy mask from an image imaged by an imaging device in which a rotation axis of a camera and a center of a lens do not match includes measuring a distance from the camera to an object in a first imaging condition; creating a first mask for the object, and storing the distance together with the first mask; and creating a second mask for the object in a second imaging condition and correcting a position of the second mask using the first mask and the distance, wherein an imaging angle of the camera in the first imaging condition is same as the imaging angle of the camera in the second imaging condition, and wherein a position of the lens in the first imaging condition is reversed around the rotation axis from a position of the lens in the second imaging condition.

Abstract: A method of creating a privacy mask from an image imaged by an imaging device in which a rotation axis of a camera and a center of a lens do not match includes measuring a distance from the camera to an object in a first imaging condition; creating a first mask for the object, and storing the distance together with the first mask; and creating a second mask for the object in a second imaging condition and correcting a position of the second mask using the first mask and the distance, wherein an imaging angle of the camera the first imaging condition is same as the imaging angle of the camera in the second imaging condition, and wherein a position of the lens in the first imaging condition is reversed around the rotation axis from a position of the lens in the second imaging condition.

Abstract: A method of creating a privacy mask from an image imaged by an imaging device in which a rotation axis of a camera and a center of a lens do not match includes measuring a distance from the camera to an object in a first imaging condition; creating a first mask for the object, and storing the distance together with the first mask; and creating a second mask for the object in a second imaging condition and correcting a position of the second mask using.

Abstract: A vaporizer includes a main body including a first body and a second body. The first body has an upper portion narrowing in a direction of a height of the first body and the second body has a cavity in which the first body is positioned. A mixing chamber is between the first and second bodies. The second body includes a carrier gas injection path connected to a carrier gas inlet formed in an upper portion of the mixing chamber. The carrier gas injection path carries a carrier gas. A source material injection path is connected to a source material inlet formed in the mixing chamber. The source material injection path carries a liquid source material. A discharge is connected to an outlet formed in a lower portion of the mixing chamber. A mixed fluid including the carrier gas and the liquid source material is discharged through the discharge path.

Abstract: A vaporizer includes a main body including a first body and a second body. The first body has an upper portion narrowing in a direction of a height of the first body and the second body has a cavity in which the first body is positioned. A mixing chamber is between the first and second bodies. The second body includes a carrier gas injection path connected to a carrier gas inlet formed in an upper portion of the mixing chamber. The carrier gas injection path carries a carrier gas. A source material injection path is connected to a source material inlet formed in the mixing chamber. The source material injection path carries a liquid source material. A discharge is connected to an outlet formed in a lower portion of the mixing chamber. A mixed fluid including the carrier gas and the liquid source material is discharged through the discharge path.

Abstract: The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.

Abstract: The present invention relates to a communication test apparatus. The communication test apparatus includes an insertion module configured to insert a test agent into the process control block, a hooking module configured to hook a test target to a test code using the test agent when an event-related to communication occurs between the plurality of processes, a scanning module configured to collect pieces of test information about communication between the plurality of processes when the test target is hooked to the test code, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: A method and a system that checks software and includes a hooking module that collects process control block (PCB) information corresponding to each process on a kernel by being executed at the time of booting a system. In addition, the system includes a safety service module that searches and defends the defects of the process by being inserted into a memory region of the process based on the collected PCB information.

Abstract: The present invention relates to a communication test apparatus. The communication test apparatus includes an insertion module configured to insert a test agent into the process control block, a hooking module configured to hook a test target to a test code using the test agent when an event-related to communication occurs between the plurality of processes, a scanning module configured to collect pieces of test information about communication between the plurality of processes when the test target is hooked to the test code, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.

Abstract: The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: Searching for a Point of Interest (POI) in a navigation apparatus includes accessing a preset driving route that includes a group of route points. A POI is associated with each route point in the group. The associated POIs are stored in a first storing unit. A current position of a moving object is determined. After storing the associated POIs, a current route point corresponding to the current position of the moving object is selected from among the group of route points. The POI associated with the current route point is accessed from storage, and information associated with the POI associated with the current route point is accessed from storage and outputted.

Abstract: A sputtering apparatus for manufacturing semiconductor devices, and a sputtering method using the same, allows for the formation of metal layers having good step coverage and good deposition rate. The sputtering apparatus for manufacturing semiconductor devices includes a process chamber; a target; a backing plate for the target; a cooling gas line on or in the backing plate, such that a cooling gas for cooling the target is circulated through the cooling gas line; and a cooling gas supply apparatus for supplying, discharging and recirculating cooling gas to and from the cooling gas line of the backing plate. The sputtering process is carried out with a high frequency power applied at 15 kW to 45 kW, argon gas supplied at 3 sccm to 10 sccm, and inner pressure in the process chamber at 0.1 mTorr to 1 mTorr. This sputtering apparatus does not require a collimator, therefore none of the particles generated when using a collimator are present to damage the wafers processed in this apparatus.