Patents by Inventor Jurgen Ettmuller

Jurgen Ettmuller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7821641
    Abstract: A three-dimensional flow cell for aligning non-isometric particles in a liquid sample in two axes, a method of aligning non-isometric particles in a liquid sample, the use of the three-dimensional flow cell, a reflectance sensor which has the three-dimensional flow cell according to the invention, a method of measuring the reflectance of a liquid sample containing non-isometric particles and the use of the reflectance sensor according to the invention.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: October 26, 2010
    Assignee: BASF Corporation
    Inventors: Beate Wagner, Jürgen Ettmüller, Michael Schäfer, Jürgen Lohmann, Jan Berg, Andreas Daiss
  • Patent number: 7602497
    Abstract: The invention relates to reflectance sensors built up from an optical unit, a sample analysis unit and a system control unit, and to a method of measuring the reflectance of a sample in the form of a liquid pigment preparation, and to the use of a reflectance sensor according to the invention for the measurement of the reflectance of liquid pigment preparations in various process stages during the production, further processing and use of the liquid pigment preparations.
    Type: Grant
    Filed: July 1, 2004
    Date of Patent: October 13, 2009
    Assignee: BASF Coatings AG
    Inventors: Jan Berg, Jürgen Lohmann, Michael Schäfer, Jürgen Ettmüller
  • Publication number: 20080279448
    Abstract: A method for automated determination of an individual three-dimensional shape of particles includes: a) dosing, alignment, and automated delivery of the particles; b) observation of the aligned particles and image acquisition, and c) evaluation of the images. A device for automated determination of the individual three-dimensional shape of particles includes: a) a mechanism for dosing, alignment, and automated delivery of the particles; b) at least two cameras for observation of the aligned particles, and c) a mechanism for evaluation of the images. The device can be used for automated determination of individual three-dimensional shape of particles.
    Type: Application
    Filed: November 16, 2006
    Publication date: November 13, 2008
    Applicant: BASF SE
    Inventors: Michael Schafer, Jurgen Ettmuller, Stefan Ziegler, Klaus Reindel
  • Publication number: 20080019887
    Abstract: A three-dimensional flow cell for aligning non-isometric particles in a liquid sample in two axes, a method of aligning non-isometric particles in a liquid sample, a reflectance sensor which has the three-dimensional flow cell according to the invention, a method of measuring the reflectance of a liquid sample containing non-isometric particles and the use of the reflectance sensor according to the invention.
    Type: Application
    Filed: December 22, 2004
    Publication date: January 24, 2008
    Applicant: BASF COATINGS AG
    Inventors: Jurgen Lohmann, Beate Wagner, Jurgen Ettmuller, Michael Schafer, Jan Berg, Andreas Daiss
  • Publication number: 20070058171
    Abstract: The invention relates to reflectance sensors built up from an optical unit, a sample analysis unit and a system control unit, and to a method of measuring the reflectance of a sample in the form of a liquid pigment preparation, and to the use of a reflectance sensor according to the invention for the measurement of the reflectance of liquid pigment preparations in various process stages during the production, further processing and use of the liquid pigment preparations.
    Type: Application
    Filed: July 1, 2004
    Publication date: March 15, 2007
    Applicant: BASF Coatings Aktiengesellschaft
    Inventors: Jan Berg, Jurgen Lohmann, Michael Schafer, Jurgen Ettmuller
  • Patent number: 7009186
    Abstract: In a method for monitoring of polymer in a liquid state, such as a polymer melt or resin, to detect inhomogeneities therein, such as the presence of other phase objects, especially gels in a matrix formed of the liquid state, the polymer in a liquid state flowing past an inspection point is monitored. At the inspection point, electromagnetic radiation in the form of UV light or polarised electromagnetic radiation is passed through the flow chamber (1) and received by a detector (8), and the absorption of the UV light or the changes in the state of polarisation of the electromagnetic radiation caused by the inhomogeneities are used to observe them.
    Type: Grant
    Filed: January 3, 2002
    Date of Patent: March 7, 2006
    Assignee: Valtion Teknillinen Tutkimuskeskus
    Inventors: Janusz Sadowski, Jyrki Salminen, Peter Huber, Camie Heffels, Marian Mours, Klaus Reindel, Jürgen Ettmüller
  • Publication number: 20040070752
    Abstract: In a method for monitoring of polymer in a liquid state, such as a polymer melt or resin, to detect inhomogeneities therein, such as the presence of other phase objects, especially gels in a matrix formed of the liquid state, the polymer in a liquid state flowing past an inspection point is monitored. At the inspection point, electromagnetic radiation in the form of UV light or polarised electromagnetic radiation is passed through the flow chamber (1) and received by a detector (8), and the absorption of the UV light or the changes in the state of polarisation of the electromagnetic radiation caused by the inhomogeneities are used to observe them.
    Type: Application
    Filed: November 24, 2003
    Publication date: April 15, 2004
    Inventors: Janusz Sadowski, Jyrki Salminen, Peter Huber, Camie Heffels, Marian Mours, Klaus Reindel, Jurgen Ettmuller
  • Patent number: 6674529
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: January 6, 2004
    Assignee: BASF Aktiengesellschaft
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Rädle, Helmut Biermann, Hans Jürgen Eisen, Jürgen Ettmüller, Johannes G Reuvers
  • Patent number: 6535283
    Abstract: The disclosure is a probelike apparatus (16) for spectroscopic analysis of a fluid medium (19) by attenuated reflection. Two light beams from a light source (11) impinge upon the boundary (18) between a prism (17) and the medium (19) to be analyzed and the intensities of the light beams reflected at the boundary are measured in a detector unit (22). The two light beams differ in their angle of incidence on the boundary and/or in their polarization state. Measurement is preferably carried out under total reflection.
    Type: Grant
    Filed: December 3, 1999
    Date of Patent: March 18, 2003
    Assignee: BASF Aktiengesellschaft
    Inventors: Camiel Heffels, Thomas Beuermann, Matthias Rädle, Benno Sens, Alfred Rennig, Jürgen Ettmüller
  • Publication number: 20020018204
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Application
    Filed: July 27, 2001
    Publication date: February 14, 2002
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Radle, Helmut Biermann, Hans Jurgen Eisen, Jurgen Ettmuller, Johannes G. Reuvers
  • Patent number: 6098450
    Abstract: In a proposed method for determining the immobilization of a colloidal coating dispersion which is applied to a porous substrate, the colloidal coating dispersion is applied to the porous substrate which forms a bounding surface of the measuring gap of a rheometer, and the change in the viscosity as a function of time is measured. The method is particularly suitable for measuring the immobilization of a paper coating slip on base paper.
    Type: Grant
    Filed: July 15, 1998
    Date of Patent: August 8, 2000
    Assignee: BASF Aktiengelsellschaft
    Inventors: Norbert Willenbacher, Harutyun Hanciogullari, Matthias Radle, Jurgen Ettmuller
  • Patent number: 5953129
    Abstract: A method for the continuous colorimetry of plastics molding compounds, which involves light being introduced, via transmitter light pipes and a sensor head, into the melt of the molding compound and the light reflected there being passed, via receiver light pipes, to a spectrometer or multirange photometer, conjugate transmitter and receiver light pipes in each case being spaced equidistantly.
    Type: Grant
    Filed: June 26, 1997
    Date of Patent: September 14, 1999
    Assignee: BASF Aktiengesellschaft
    Inventors: Rainer Anderlik, Jurgen Ettmuller, Matthias Radle, Paulus Schmaus, Norbert Modersheim