Patents by Inventor Justin E. Forrester

Justin E. Forrester has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Encoded micro pattern
    Patent number: 9378444
    Abstract: In embodiments, an encoded micro pattern includes segments of encoded bits that can be optically-imaged by a digitizer. The position of each segment in the encoded micro pattern can be determined from the encoded bits in a segment. Each of the segments of the encoded micro pattern also includes a fiducial marker that indicates an orientation of a segment in the encoded pattern. The encoded bits of the encoded micro pattern can be integrated into a display surface of a display device, or integrated in a display screen that is positioned over the display surface of a display device.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: June 28, 2016
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Derek Leslie Knee, Randall T. Crane, David D. Bohn, Justin E. Forrester, David C. Rohn, Brian L. Hastings
  • Encoded Micro Pattern
    Publication number: 20120162145
    Abstract: In embodiments, an encoded micro pattern includes segments of encoded bits that can be optically-imaged by a digitizer. The position of each segment in the encoded micro pattern can be determined from the encoded bits in a segment. Each of the segments of the encoded micro pattern also includes a fiducial marker that indicates an orientation of a segment in the encoded pattern. The encoded bits of the encoded micro pattern can be integrated into a display surface of a display device, or integrated in a display screen that is positioned over the display surface of a display device.
    Type: Application
    Filed: December 23, 2010
    Publication date: June 28, 2012
    Applicant: Microsoft Corporation
    Inventors: Derek Leslie Knee, Randall T. Crane, David C. Rohn, Justin E. Forrester, David D. Bohn, Brian L. Hastings