Abstract: A wave energy capture system can include a plurality of arm assemblies. Each arm assembly includes a floatation device and an arm that is coupled to the floatation device and to a body via a pivot. The arm assemblies independently pivot around the pivots with respect to the body in response to movement of the floatation devices caused by waves in water. A mechanical energy capture system converts the independent pivoting of the plurality of arm assemblies around the pivots to electrical energy and provides the electrical energy to either an electronic device that is electrically coupled to the mechanical energy capture system to power the electronic device, or to a battery to recharge the battery.

Abstract: A wave energy capture system deployed in water converts mechanical motion induced by waves in the water to electrical energy. A controller of the wave energy capture system receives input regarding real-time wave conditions in a vicinity of the wave energy capture system. The controller applies a control model to the received input to select a value of a control parameter for the wave energy capture system, where the control model includes a model that has been trained using machine learning to take wave condition data as input and to output control parameter values selected based on the wave condition data in order to increase an amount of energy captured by the wave energy capture system. The controller implements the selected value of the control parameter on the wave energy capture system.

Abstract: A system includes a current measurement unit, an overload timer, and a processing unit. The current measuring unit measures current through a power transistor, and the overload timer measures an overload time associated with the measured current. The processing unit receives a user-specified overload time setting or a user-specified overload amperage setting associated with a protection device connected in series with a load, receives a temperature measurement of a component associated with the power transistor or a measurement of overload time associated with the current, wherein the power transistor supplies the current to the load and the protection device, and selectively turns off the power transistor based on the measured temperature, the measured current through the power transistor, and the user-specified overload amperage setting or based on the measured temperature, the measured overload time, and the user-specified overload time.

Abstract: A system includes a first phase-locked loop (PLL) circuit, a slew rate limiter and a second PLL. The first PLL is configured to receive an input signal, generate a first output identifying a frequency associated with the input signal, and generate a second output identifying phase information associated with the input signal. The slew rate limiter is configured to receive the first output from the first PLL, determine whether the frequency of the first output is changing at greater than a predetermined rate, and generate a first signal indicating whether the frequency is changing at greater than the predetermined rate. The second PLL is configured to receive the first signal from the slew rate limiter, receive the second output from the first PLL, and generate an output signal identifying an angle or phase information based on the first signal and the second output.

Abstract: A system includes a current measurement unit, an overload timer, and a processing unit. The current measuring unit measures current through a power transistor, and the overload timer measures an overload time associated with the measured current. The processing unit receives a user-specified overload time setting or a user-specified overload amperage setting associated with a protection device connected in series with a load, receives a temperature measurement of a component associated with the power transistor or a measurement of overload time associated with the current, wherein the power transistor supplies the current to the load and the protection device, and selectively turns off the power transistor based on the measured temperature, the measured current through the power transistor, and the user-specified overload amperage setting or based on the measured temperature, the measured overload time, and the user-specified overload time.

Abstract: A system includes a first phase-locked loop (PLL) circuit, a slew rate limiter and a second PLL. The first PLL is configured to receive an input signal, generate a first output identifying a frequency associated with the input signal, and generate a second output identifying phase information associated with the input signal. The slew rate limiter is configured to receive the first output from the first PLL, determine whether the frequency of the first output is changing at greater than a predetermined rate, and generate a first signal indicating whether the frequency is changing at greater than the predetermined rate. The second PLL is configured to receive the first signal from the slew rate limiter, receive the second output from the first PLL, and generate an output signal identifying an angle or phase information based on the first signal and the second output.