Patents by Inventor Jyh-Herng Wang

Jyh-Herng Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7596772
    Abstract: A fast methodology and system to characterize setup/hold time for analog IPs are provided. Partial circuits of clock and data paths are simulated instead of the simulation of entire IPs. The partial circuits include all those paths of clock pin and data input pins before reaching first level DFF. This methodology includes multi-path searching of hierarchical SPICE netlist for the path of clock pin and data pins, so as to reduce the circuit subset, merge the paths of clock pin and the data pins, and characterize the setup/hold time for the analog IP. The paths of data pins and clock pin before DFF are used for setup/hold time characterization.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: September 29, 2009
    Assignee: Faraday Technology Corp.
    Inventors: Hanping Chen, Chih-Yang Peng, Alvin Hsin-Hung Chen, Jia-Jio Huang, Jim Jyh-Herng Wang, Kun-Cheng Wu
  • Patent number: 7530035
    Abstract: An automatic power grid synthesis method and a computer readable recording medium for storing a program thereof for synthesizing power grid in a circuit area are provided. The circuit area has at least one power consuming module therein and at least one power pin disposed around the circuit area. The method includes the following steps. First, select at least one representative point in each power consuming module. The circuit area is divided into a plurality of regions according to the positions of the representative point(s) and the power pin. An overall power grid density of each region is calculated in accordance with the position of each power pin and the power consumption or current requirement at each representative point. Finally, the power grid synthesis is performed in each region according to the corresponding overall power grid density of the region.
    Type: Grant
    Filed: August 25, 2005
    Date of Patent: May 5, 2009
    Assignee: Faraday Technology Corp.
    Inventor: Jyh-Herng Wang
  • Patent number: 7516058
    Abstract: IP characterization and for path finding methods, and a computer readable recording medium for storing program are provided. First, an Intellectual Property (IP) component is provided. Then, a plurality of test patterns for all paths in the IP component is automatically generated. The test patterns are then sequentially input into the IP component for simulation, and a plurality of corresponding simulation results is generated. Finally, an IP characteristic library is generated based on the simulation results.
    Type: Grant
    Filed: September 21, 2004
    Date of Patent: April 7, 2009
    Assignee: Faraday Technology Corp.
    Inventors: Peter Hanping Chen, Chih-Fu Chien, Jyh-Herng Wang, Hsu-Hui Tsai
  • Patent number: 7516427
    Abstract: A methodology for characterization of an IP (Intellectual Property) component is provided. Digital pins are recognized by skipping analog pins and special IO pins. First two layers of the IP component are classified in response to connection of the input pins. Partial circuits of the IP component are extracted for simulation. Three corners of IP library are generated. Therefore, input capacitance of the IP component is simulated.
    Type: Grant
    Filed: August 5, 2005
    Date of Patent: April 7, 2009
    Assignee: Faraday Technology Corp
    Inventors: Peter H. Chen, Han-Chi Liu, Chih-Yang Peng, Jyh-Herng Wang, Chia-Nan Hong
  • Patent number: 7389488
    Abstract: A method of finding a driving strength and a record medium accessible by a computer to store a program thereof are provided. The method is adapted to find the driving strength of an output pin of a target cell. Wherein, the driving strength of the output pin of the target cell is provided from the driving strength of a corresponding last level device. In this method, at least one candidate standard cell is searched in a standard cell library according to the last level device. Then, the driving strength of the target cell is interpolated between the driving strengths of the candidate standard cells to obtain the driving strength of the output pin of the target cell.
    Type: Grant
    Filed: May 25, 2005
    Date of Patent: June 17, 2008
    Assignee: Faraday Technology Corp.
    Inventors: Peter H. Chen, Chih-Fu Chien, Han-chi Liu, Jyh-Herng Wang
  • Publication number: 20080141198
    Abstract: A fast methodology and system to characterize setup/hold time for analog IPs are provided. Partial circuits of clock and data paths are simulated instead of the simulation of entire IPs. The partial circuits include all those paths of clock pin and data input pins before reaching first level DFF. This methodology includes multi-path searching of hierarchical SPICE netlist for the path of clock pin and data pins, so as to reduce the circuit subset, merge the paths of clock pin and the data pins, and characterize the setup/hold time for the analog IP. The paths of data pins and clock pin before DFF are used for setup/hold time characterization.
    Type: Application
    Filed: December 8, 2006
    Publication date: June 12, 2008
    Applicant: FARADAY TECHNOLOGY CORP.
    Inventors: Hanping Chen, Chih-Yang Peng, Alvin Hsin-Hung Chen, Jia-Jio Huang, Jim Jyh-Herng Wang, Kun-Cheng Wu
  • Publication number: 20070214438
    Abstract: A method for static power characterization of an analog integrated circuit includes detecting whether each of a plurality of input pins is electrically connected to a specific circuit; selecting a plurality of test benches of the static power characterization according to a number of the input pins electrically connected to the specific circuit; and processing the plurality of selected test benches of the static power characterization.
    Type: Application
    Filed: March 9, 2006
    Publication date: September 13, 2007
    Inventors: Peter H. Chen Hanping Chen, Jyh-Herng Wang, Chih-Yang Peng, Han-Chi Liu, Hsin-Hung Chen, Kun-Cheng Wu
  • Publication number: 20070050747
    Abstract: An automatic power grid synthesis method and a computer readable recording medium for storing a program thereof for synthesizing power grid in a circuit area are provided. The circuit area has at least one power consuming module therein and at least one power pin disposed around the circuit area. The method includes the following steps. First, select at least one representative point in each power consuming module. The circuit area is divided into a plurality of regions according to the positions of the representative point(s) and the power pin. An overall power grid density of each region is calculated in accordance with the position of each power pin and the power consumption or current requirement at each representative point. Finally, the power grid synthesis is performed in each region according to the corresponding overall power grid density of the region.
    Type: Application
    Filed: August 25, 2005
    Publication date: March 1, 2007
    Inventor: Jyh-Herng Wang
  • Publication number: 20070033547
    Abstract: A methodology for characterization of an IP (Intellectual Property) component is provided. Digital pins are recognized by skipping analog pins and special IO pins. First two layers of the IP component are classified in response to connection of the input pins. Partial circuits of the IP component are extracted for simulation. Three corners of IP library are generated. Therefore, input capacitance of the IP component is simulated.
    Type: Application
    Filed: August 5, 2005
    Publication date: February 8, 2007
    Inventors: Peter Chen, Han-Chi Liu, Chih-Yang Peng, Jyh-Herng Wang, Chia-Nan Hong
  • Publication number: 20060271889
    Abstract: A method of finding a driving strength and a record medium accessible by a computer to store a program thereof are provided. The method is adapted to find the driving strength of an output pin of a target cell. Wherein, the driving strength of the output pin of the target cell is provided from the driving strength of a corresponding last level device. In this method, at least one candidate standard cell is searched in a standard cell library according to the last level device. Then, the driving strength of the target cell is interpolated between the driving strengths of the candidate standard cells to obtain the driving strength of the output pin of the target cell.
    Type: Application
    Filed: May 25, 2005
    Publication date: November 30, 2006
    Inventors: Peter H. Chen, Chih-Fu Chien, Han-chi Liu, Jyh-Herng Wang
  • Publication number: 20060062155
    Abstract: IP characterization and for path finding methods, and a computer readable recording medium for storing program are provided. First, an Intellectual Property (IP) component is provided. Then, a plurality of test patterns for all paths in the IP component is automatically generated. The test patterns are then sequentially input into the IP component for simulation, and a plurality of corresponding simulation results is generated. Finally, an IP characteristic library is generated based on the simulation results.
    Type: Application
    Filed: September 21, 2004
    Publication date: March 23, 2006
    Inventors: Peter Hanping Chen, Chih-Fu Chien, Jyh-Herng Wang, Hsu-Hui Tsai
  • Patent number: 6404222
    Abstract: A silicon chip capacitance measurement circuit including three pairs of completely matched MOS transistors divided into two symmetrical circuits. Capacitance of a capacitor within the silicon chip is measured using the difference in average charging current flowing from the measurement circuit via a left and a right capacitor. A power supply provides a constant voltage source to the measurement circuit. A current measuring device measures the current flowing from the power supply to the measurement circuit. A signal generator provides a group of three-phase non-overlapping signals to the measurement circuit. The capacitance measurement circuit is able to limit measurement error due to the return of different size negative currents leading to the transient switching of MOS transistors in the current measurement device so that accuracy of capacitance measurement improves.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: June 11, 2002
    Assignee: Faraday Technology Corp.
    Inventors: Chen-Teng Fan, Jyh-Herng Wang
  • Patent number: 6380788
    Abstract: A clock architecture including a clock source, a multi-phase clock signal generator, a control bus, a number of clock signal lines, and at least one circuit block. The clock source generates a global clock signal, which is then transferred to the multi-phase clock signal generator connected to the clock source. Upon receipt of global clock signal, the multi-phase clock signal generator, which is connected to a control bus, generates clock signals of different phases according to the signals from the control bus. Each of the clock signal branches transfers one of the clock signals of different phases, wherein each of the clock signal branches is individually connected to the circuit block through an electrical switch. Only one switch is at an on state at one time, so that the clock signal of a corresponding phase is transferred to the circuit block. The driving forces applied on the clock buffer connected to the clock source and the clock buffers on the branches are adjustable for reducing clock skew.
    Type: Grant
    Filed: May 9, 2001
    Date of Patent: April 30, 2002
    Assignee: Faraday Technology Corp.
    Inventors: Chen-Teng Fan, Jyh-Herng Wang, Yu-Wen Tsai, Peng-Chuan Huang