Abstract: A quantum device includes a resonator and a tuning structure. The tuning structure is made a material such as a chalcogenide and is positioned to interact with the electromagnetic radiation in the resonator so that a resonant mode of the first resonator depends on a characteristic of the tuning structure. The resonator is optically coupled so that a transition between quantum states associated with a defect produces electromagnetic radiation in the resonator. The characteristic of the tuning structure is adjustable after fabrication of the resonator and the tuning structure.

Abstract: A process for entangling quantum states of respective quantum systems measures electromagnetic radiation emitted from a first system and from a second system. The two systems are exposed to excitation radiation having a probability per time of producing a photon, and an interference element is coupled to receive photons from the first and second systems. The process further includes measuring a time during which the first and second systems were exposed to the excitation radiation before a photon is detected on either output channel of the interference element and applying an electromagnetic pulse that causes a relative phase shift of a portion of a quantum state of the first and second systems. Parameters of the electromagnetic pulse are selected based on measurements of the electromagnetic radiation from the first and second systems and the time measured.

Abstract: A quantum device includes a resonator and a tuning structure. The tuning structure is made a material such as a chalcogenide and is positioned to interact with the electromagnetic radiation in the resonator so that a resonant mode of the first resonator depends on a characteristic of the tuning structure. The resonator is optically coupled so that a transition between quantum states associated with a defect produces electromagnetic radiation in the resonator. The characteristic of the tuning structure is adjustable after fabrication of the resonator and the tuning structure.

Abstract: A process for entangling quantum states of respective quantum systems measures electromagnetic radiation emitted from a first system and from a second system. The two systems are exposed to excitation radiation having a probability per time of producing a photon, and an interference element is coupled to receive photons from the first and second systems. The process further includes measuring a time during which the first and second systems were exposed to the excitation radiation before a photon is detected on either output channel of the interference element and applying an electromagnetic pulse that causes a relative phase shift of a portion of a quantum state of the first and second systems. Parameters of the electromagnetic pulse are selected based on measurements of the electromagnetic radiation from the first and second systems and the time measured.

Abstract: A system for event detection uses a resistive switching device to record a detected event. The resistive switching device has a resistance adjustable by an applied voltage. The operation of the resistive switching device is controlled by a controller, which is configured to apply a switching voltage to the resistive switching device at a start time, and turn off the switching voltage in response to an event signal indicative of occurrence of an event. The resistance value of the resistive switching device resulting from the application of the switching voltage is indicative of the detection of the event and also the time of the occurrence of the event.

Abstract: A system for event detection uses a resistive switching device to record a detected event. The resistive switching device has a resistance adjustable by means of an applied voltage. The operation of the resistive switching device is controlled by a controller, which is configured to apply a switching voltage to the resistive switching device at a start time, and turn off the switching voltage in response to an event signal indicative of occurrence of an event. The resistance value of the resistive switching device resulting from the application of the switching voltage is indicative of the detection of the event and also the time of the occurrence of the event.