Abstract: A resonant frequency testing system for airfoils comprises a broach block, a clamp, an acoustic speaker, a laser vibrometer, and a control processor assembly. The broach block has a slot disposed to receive the airfoil in an airfoil location. The clamp has a torque-actuated shutoff, and is disposed to lock the airfoil in the broach block slot under a fixed clamping force. The acoustic sensor is disposed adjacent the airfoil location to emit sonic pulses, and the laser vibrometer is oriented towards the airfoil location to sense vibration signatures of the airfoil when excited by the sonic pulses. The control processor assembly is configured to control the acoustic speaker and laser vibrometer, to decompose the sensed vibration signatures into resonant frequencies of the airfoil, and to store the resonant frequencies in a digital storage database, correlated with a unique ID corresponding to the airfoil.

Abstract: A resonant frequency testing system for airfoils comprises a broach block, a clamp, an acoustic speaker, a laser vibrometer, and a control processor assembly. The broach block has a slot disposed to receive the airfoil in an airfoil location. The clamp has a torque-actuated shutoff, and is disposed to lock the airfoil in the broach block slot under a fixed clamping force. The acoustic sensor is disposed adjacent the airfoil location to emit sonic pulses, and the laser vibrometer is oriented towards the airfoil location to sense vibration signatures of the airfoil when excited by the sonic pulses.

Abstract: A sheet wafer has a generally flat, generally rectangular shaped body with a length and a width, and first and second filaments generally perpendicular to the width of the body. The first and second filaments are at least partially encapsulated by a wafer material and, together with the wafer material, form at least a portion of the body. The width is between about 145 mm and 165 mm.

Abstract: A sheet wafer growth system includes a crucible for containing molten material and an afterheater positioned above the crucible. The afterheater has an inner surface disposed toward the crucible. The system further includes one or more shields adjacent to the inner surface of the afterheater. The afterheater and the shield(s) are configured to allow a sheet wafer to pass adjacent to the shield(s). Each shield has two or more substantially different thermally conductive regions such that the two or more regions are configured to control the temperature profile of the growing sheet wafer.

Abstract: A method of applying cleaning and treatment compositions to substrates, especially nonwovens, by incorporating air into a heated gel composition allows good coverage of the substrate.