Abstract: Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.

Abstract: A system is based on an IC. A first component of the IC generates a signal that clocks the IC at a target operating frequency. A period corresponding to the target clock frequency exceeds a duration of a longest critical path associated with the IC. The first component and synchronous logic of the IC clocked therewith, each functions with the core supply voltage, which may be supplied to each via the same power supply rail. A second IC component detects errors that relate to an operation of the IC at the target clock frequency and determines a level for adjusting the core supply voltage. The Vdd adjustment ameliorates the frequency error. The voltage determination uses closed loop dynamic voltage and frequency scaling.

Abstract: Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.

Abstract: Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.

Abstract: A system is based on an IC. A first component of the IC generates a signal that clocks the IC at a target operating frequency. A period corresponding to the target clock frequency exceeds a duration of a longest critical path associated with the IC. The first component and synchronous logic of the IC clocked therewith, each functions with the core supply voltage, which may be supplied to each via the same power supply rail. A second IC component detects errors that relate to an operation of the IC at the target clock frequency and determines a level for adjusting the core supply voltage. The Vdd adjustment ameliorates the frequency error. The voltage determination uses closed loop dynamic voltage and frequency scaling.

Abstract: Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.