Patents by Inventor Kantaro Maruoka

Kantaro Maruoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9897579
    Abstract: Disclosed herein is a method for correcting an evolved gas analyzer and the evolved gas analyzer. The method includes: correcting a mass spectrum position to be located at a reference spectrum position, the mass spectrum position corresponding to a mass-to-charge ratio m/z of a mass spectrum of a gas component of a reference sample; calculating a sensitivity correction factor Cs=Ss/S by using an area S and a reference area Ss of a chromatogram, the sensitivity correction factor being used to measure an area of a chromatogram of the gas component of a test sample; and calculating a heating correction factor H=t/ts by using a time t and a reference time is indicating a maximum peak of the chromatogram about the reference sample, the heating correction factor being used to correct a heating rate of the test sample when measuring the gas component of the test sample.
    Type: Grant
    Filed: November 19, 2016
    Date of Patent: February 20, 2018
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki Akiyama, Kantaro Maruoka
  • Patent number: 9899198
    Abstract: Disclosed herein is a method for analyzing evolved gas and an evolved gas analyzer, the method correcting detection sensitivity differences in analysis devices, day-to-day variations thereof, thereby quantifying a measurement target with high accuracy. The method for analyzing evolved gas of the apparatus including: a sample holder; a heating unit evolving a gas component; an ion source generating ions by ionizing the gas component; a mass spectrometer detecting the gas component; and a gas channel through which mixed gas flows, the method including: operating a discharged flow rate controlling process of controlling a flow rate of the mixed gas discharged to outside; operating a sample holder cooling process of cooling the sample holder by bringing the sample holder into contact with a cooling unit; and operating a correction process including: correcting a mass spectrum position; calculating a sensitivity correction factor; and calculating a heating correction factor.
    Type: Grant
    Filed: November 19, 2016
    Date of Patent: February 20, 2018
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki Akiyama, Kentaro Yamada, Masafumi Watanabe, Toshitada Takeuchi, Kantaro Maruoka
  • Patent number: 9831077
    Abstract: Disclosed herein is an evolved gas analyzer and a method for analyzing evolved gas, the apparatus enhancing detection accuracy for gas component without providing the apparatus in a large size. The apparatus includes a heating unit evolving a gas component by heating a sample, a detecting means detecting the gas component, a gas channel connecting the heating unit to the detecting means, the gas channel through which mixed gas of the gas component and carrier gas flows, wherein the gas channel includes a branching channel being open to outside and including a discharge flow rate controlling device, and a flow rate control device controlling the discharge flow rate controlling device based on a detection signal received from the detecting means so as to control the detection signal to be within a predetermined range.
    Type: Grant
    Filed: November 19, 2016
    Date of Patent: November 28, 2017
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki Akiyama, Masafumi Watanabe, Kantaro Maruoka
  • Publication number: 20170148616
    Abstract: Disclosed herein is an evolved gas analyzer and a method for analyzing evolved gas, the apparatus enhancing detection accuracy for gas component without providing the apparatus in a large size. The apparatus includes a heating unit evolving a gas component by heating a sample, a detecting means detecting the gas component, a gas channel connecting the heating unit to the detecting means, the gas channel through which mixed gas of the gas component and carrier gas flows, wherein the gas channel includes a branching channel being open to outside and including a discharge flow rate controlling device, and a flow rate control device controlling the discharge flow rate controlling device based on a detection signal received from the detecting means so as to control the detection signal to be within a predetermined range.
    Type: Application
    Filed: November 19, 2016
    Publication date: May 25, 2017
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki AKIYAMA, Masafumi WATANABE, Kantaro MARUOKA
  • Publication number: 20170148617
    Abstract: Disclosed herein is a method for analyzing evolved gas and an evolved gas analyzer, the method correcting detection sensitivity differences in analysis devices, day-to-day variations thereof, thereby quantifying a measurement target with high accuracy. The method for analyzing evolved gas of the apparatus including: a sample holder; a heating unit evolving a gas component; an ion source generating ions by ionizing the gas component; a mass spectrometer detecting the gas component; and a gas channel through which mixed gas flows, the method including: operating a discharged flow rate controlling process of controlling a flow rate of the mixed gas discharged to outside; operating a sample holder cooling process of cooling the sample holder by bringing the sample holder into contact with a cooling unit; and operating a correction process including: correcting a mass spectrum position; calculating a sensitivity correction factor; and calculating a heating correction factor.
    Type: Application
    Filed: November 19, 2016
    Publication date: May 25, 2017
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki AKIYAMA, Kentaro YAMADA, Masafumi WATANABE, Toshitada TAKEUCHI, Kantaro MARUOKA
  • Publication number: 20170146497
    Abstract: Disclosed herein is a method for correcting an evolved gas analyzer and the evolved gas analyzer. The method includes: correcting a mass spectrum position to be located at a reference spectrum position, the mass spectrum position corresponding to a mass-to-charge ratio m/z of a mass spectrum of a gas component of a reference sample; calculating a sensitivity correction factor Cs=Ss/S by using an area S and a reference area Ss of a chromatogram, the sensitivity correction factor being used to measure an area of a chromatogram of the gas component of a test sample; and calculating a heating correction factor H=t/ts by using a time t and a reference time is indicating a maximum peak of the chromatogram about the reference sample, the heating correction factor being used to correct a heating rate of the test sample when measuring the gas component of the test sample.
    Type: Application
    Filed: November 19, 2016
    Publication date: May 25, 2017
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Hideyuki AKIYAMA, Kantaro MARUOKA
  • Publication number: 20020164807
    Abstract: Disclosed herein is a diagnostic instrument for analyzing liquid samples. The diagnostic instrument in accordance with this invention includes a sample carousel and a diagnostic carousel. The sample carousel includes at least one sample tube and in the exemplary embodiment a plurality of sample tubes, each having unique identifying indicia readable by a machine reader. The sample tube capable of storing the liquid sample to be analyzed. The diagnostic carousel including at least one pipette capable of storing liquid sample to be analyzed. There are matching number of pipettes to sample tubes and each having matching unique identifying indicia which is matched with the appropriate sample tube. The diagnostic carousel being offset from the sample carousel and lying in a different plane from the sample carousel. Each pipette including a transfer mechanism for transferring sample from the sample tube directly to the pipette.
    Type: Application
    Filed: May 3, 2001
    Publication date: November 7, 2002
    Inventors: Hideki Itaya, Jason Dominik Hool, Javier Urena, Fredrick Spears, Osamu Ohno, Kantaro Maruoka
  • Patent number: D643130
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: August 9, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D643936
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: August 23, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D645570
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: September 20, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kazuhiko Nishiyama, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D645977
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: September 27, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kazuhiko Nishiyama, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D645978
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: September 27, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D645979
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: September 27, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Yoko Sato, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D646398
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: October 4, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Patent number: D646797
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: October 11, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Hiroyuki Noda, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji