Patents by Inventor Kaoru Miyata

Kaoru Miyata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11948321
    Abstract: A three-dimensional geometry measurement apparatus including: a preliminary measurement part that creates a plurality of pieces of preliminary measurement data indicating three-dimensional coordinates of a reference point on a reference instrument; a reference data creation part that creates reference data; a calculation part that calculates a correction value on the basis of the reference data and the preliminary measurement data which does not match the reference data; a target measuring part that creates target measurement data indicating results of measuring a measurement point of the object to be measured; a correction part that corrects the target measurement data in the measurement system corresponding to the preliminary measurement data that does not match the reference data, on the basis of the correction value; and a geometry identification part that identifies a geometry of the object to be measured using the corrected target measurement data.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: April 2, 2024
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Patent number: 11636614
    Abstract: A three-dimensional geometry measurement apparatus including: a relationship identification part that identifies a combination of a first imaging pixel and a projection pixel of a projection image; a determination part that determines, for the combination of the first imaging pixel and the projection pixel, whether or not the combination includes a defective pixel on the basis of a distance between (i) a second imaging pixel corresponding to the same projection coordinate as a projection coordinate corresponding to the first imaging pixel and (ii) a second imaging pixel corresponding to the projection coordinate of the projection pixel and located on an epipolar line of a second captured image corresponding to the projection coordinate; and a geometry measurement part that measures a geometry of an object to be measured using at least one of the first imaging pixel excluding the defective pixel or the second imaging pixel excluding the defective pixel.
    Type: Grant
    Filed: May 10, 2022
    Date of Patent: April 25, 2023
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Patent number: 11449970
    Abstract: A three-dimensional geometry measurement apparatus including a virtual coordinate identification part that identifies coordinates of a virtual captured pixel corresponding to a feature point in an image plane of a capturing device by virtually projecting the feature point on a reference instrument onto the image plane: correction part that generates correction information for correcting coordinates of the measurement-target captured pixel included in a measurement-target captured image; and a geometry identification part that corrects coordinates of a plurality of the measurement-target captured pixels included in the measurement-target captured image generated by capturing an object to be measured with the capturing device on the basis of geometric property information and the correction information, and identifies a geometry of the object to be measured on the basis of measurement three-dimensional coordinates to be calculated based on the coordinates of the measurement-target captured pixels.
    Type: Grant
    Filed: January 18, 2021
    Date of Patent: September 20, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20220270274
    Abstract: A three-dimensional geometry measurement apparatus including: a relationship identification part that identifies a combination of a first imaging pixel and a projection pixel of a projection image; a determination part that determines, for the combination of the first imaging pixel and the projection pixel, whether or not the combination includes a defective pixel on the basis of a distance between (i) a second imaging pixel corresponding to the same projection coordinate as a projection coordinate corresponding to the first imaging pixel and (ii) a second imaging pixel corresponding to the projection coordinate of the projection pixel and located on an epipolar line of a second captured image corresponding to the projection coordinate; and a geometry measurement part that measures a geometry of an object to be measured using at least one of the first imaging pixel excluding the defective pixel or the second imaging pixel excluding the defective pixel.
    Type: Application
    Filed: May 10, 2022
    Publication date: August 25, 2022
    Inventor: Kaoru Miyata
  • Patent number: 11361458
    Abstract: A three-dimensional geometry measurement apparatus includes: a relationship identification part that identifies a combination of a first imaging pixel and a second imaging pixel corresponding to the same projection coordinate; a determination part that determines, whether or not at least one of the first imaging pixel or the second imaging pixel is a defective pixel on the basis of a distance between a projection pixel of the projection image; and a geometry measurement part that measures a geometry of an object to be measured using the first imaging pixel or the second imaging pixel corresponding to the combination, for which the first imaging pixel and the second imaging pixel that are determined to be not the defective pixel.
    Type: Grant
    Filed: April 17, 2020
    Date of Patent: June 14, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20210224960
    Abstract: A three-dimensional geometry measurement apparatus including a virtual coordinate identification part that identifies coordinates of a virtual captured pixel corresponding to a feature point in an image plane of a capturing device by virtually projecting the feature point on a reference instrument onto the image plane: correction part that generates correction information for correcting coordinates of the measurement-target captured pixel included in a measurement-target captured image; and a geometry identification part that corrects coordinates of a plurality of the measurement-target captured pixels included in the measurement-target captured image generated by capturing an object to be measured with the capturing device on the basis of geometric property information and the correction information, and identifies a geometry of the object to be measured on the basis of measurement three-dimensional coordinates to be calculated based on the coordinates of the measurement-target captured pixels.
    Type: Application
    Filed: January 18, 2021
    Publication date: July 22, 2021
    Inventor: Kaoru Miyata
  • Publication number: 20210174531
    Abstract: A three-dimensional geometry measurement apparatus including: a preliminary measurement part that creates a plurality of pieces of preliminary measurement data indicating three-dimensional coordinates of a reference point on a reference instrument; a reference data creation part that creates reference data; a calculation part that calculates a correction value on the basis of the reference data and the preliminary measurement data which does not match the reference data; a target measuring part that creates target measurement data indicating results of measuring a measurement point of the object to be measured; a correction part that corrects the target measurement data in the measurement system corresponding to the preliminary measurement data that does not match the reference data, on the basis of the correction value; and a geometry identification part that identifies a geometry of the object to be measured using the corrected target measurement data.
    Type: Application
    Filed: November 30, 2020
    Publication date: June 10, 2021
    Inventor: Kaoru Miyata
  • Patent number: 10891746
    Abstract: A three-dimensional geometry measurement apparatus includes: a projection part that projects a projection image onto an object to be measured; an image capturing part that generates a captured image by capturing the object to be measured on which the projection image is projected; a relationship identification part that identifies a projection pixel position having correspondence with a captured pixel position; and a defective pixel determination part that determines whether the pixel at the captured pixel position is a defective pixel on the basis of a positional relationship between a projection light beam starting from the projection part and passing through the pixel at the projection pixel position and a captured light beam starting from the image capturing part and passing through the pixel at the captured pixel position having correspondence.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: January 12, 2021
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20200334844
    Abstract: A three-dimensional geometry measurement apparatus includes: a relationship identification part that identifies a combination of a first imaging pixel and a second imaging pixel corresponding to the same projection coordinate; a determination part that determines, whether or not at least one of the first imaging pixel or the second imaging pixel is a defective pixel on the basis of a distance between a projection pixel of the projection image; and a geometry measurement part that measures a geometry of an object to be measured using the first imaging pixel or the second imaging pixel corresponding to the combination, for which the first imaging pixel and the second imaging pixel that are determined to be not the defective pixel.
    Type: Application
    Filed: April 17, 2020
    Publication date: October 22, 2020
    Inventor: Kaoru Miyata
  • Publication number: 20200090356
    Abstract: A three-dimensional geometry measurement apparatus includes: a projection part that projects a projection image onto an object to be measured; an image capturing part that generates a captured image by capturing the object to be measured on which the projection image is projected; a relationship identification part that identifies a projection pixel position having correspondence with a captured pixel position; and a defective pixel determination part that determines whether the pixel at the captured pixel position is a defective pixel on the basis of a positional relationship between a projection light beam starting from the projection part and passing through the pixel at the projection pixel position and a captured light beam starting from the image capturing part and passing through the pixel at the captured pixel position having correspondence.
    Type: Application
    Filed: August 29, 2019
    Publication date: March 19, 2020
    Inventor: Kaoru Miyata
  • Patent number: 10529082
    Abstract: A three-dimensional (3D) geometry measurement apparatus includes a projection part, a capturing part that generates a captured image of an object to be measured to which a projection image is projected, an analyzing part that obtains correspondences between projection pixel positions that are pixel positions of the projection image and captured pixel positions that are pixel positions of the captured image, a line identification part that identifies a first epipolar line of the capturing part corresponding to the captured pixel positions or a second epipolar line of the projection part corresponding to the projection pixel positions, a defective pixel detection part that detects defective pixels based on a positional relationship between the projection pixel positions and the first epipolar line or a positional relationship between the projection pixel positions and the second epipolar line, and a geometry identification part.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: January 7, 2020
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Patent number: 10317192
    Abstract: The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each pixel in the plurality of captured images by comparing the luminance value with a predetermined reference value; a selection part that selects, based on the relationship between the reference value and the luminance value for a plurality of pixels having the same coordinates in the plurality of captured images, a quantization value to be used for identifying the geometry of the object to be measured, from among a plurality of quantization values corresponding to the plurality of captured images; and a geometry identification part that identifies the geometry of the object to be measured based on the quantization value selected by the selection part.
    Type: Grant
    Filed: February 15, 2017
    Date of Patent: June 11, 2019
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20180365847
    Abstract: A three-dimensional (3D) geometry measurement apparatus includes a projection part, a capturing part that generates a captured image of an object to be measured to which a projection image is projected, an analyzing part that obtains correspondences between projection pixel positions that are pixel positions of the projection image and captured pixel positions that are pixel positions of the captured image, a line identification part that identifies a first epipolar line of the capturing part corresponding to the captured pixel positions or a second epipolar line of the projection part corresponding to the projection pixel positions, a defective pixel detection part that detects defective pixels based on a positional relationship between the projection pixel positions and the first epipolar line or a positional relationship between the projection pixel positions and the second epipolar line, and a geometry identification part.
    Type: Application
    Filed: June 8, 2018
    Publication date: December 20, 2018
    Inventor: Kaoru Miyata
  • Publication number: 20170241767
    Abstract: The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each pixel in the plurality of captured images by comparing the luminance value with a predetermined reference value; a selection part that selects, based on the relationship between the reference value and the luminance value for a plurality of pixels having the same coordinates in the plurality of captured images, a quantization value to be used for identifying the geometry of the object to be measured, from among a plurality of quantization values corresponding to the plurality of captured images; and a geometry identification part that identifies the geometry of the object to be measured based on the quantization value selected by the selection part.
    Type: Application
    Filed: February 15, 2017
    Publication date: August 24, 2017
    Inventor: Kaoru Miyata
  • Patent number: 9525266
    Abstract: A laser source device includes a laser source element configured to emit a laser beam, an optical element disposed downstream of the laser source element, and a return-light-receiving surface at a position shifted in a direction intersecting an active layer of the laser source element. The optical element is tilted with respect to an optical axis of the laser beam so that a return light in a form of a laser beam reflected by the optical element is incident on the return-light-receiving surface.
    Type: Grant
    Filed: February 19, 2016
    Date of Patent: December 20, 2016
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20160248222
    Abstract: A laser source device includes a laser source element configured to emit a laser beam, an optical element disposed downstream of the laser source element, and a return-light-receiving surface at a position shifted in a direction intersecting an active layer of the laser source element. The optical element is tilted with respect to an optical axis of the laser beam so that a return light in a form of a laser beam reflected by the optical element is incident on the return-light-receiving surface.
    Type: Application
    Filed: February 19, 2016
    Publication date: August 25, 2016
    Applicant: MITUTOYO CORPORATION
    Inventor: Kaoru MIYATA
  • Patent number: 8368900
    Abstract: The oscillation wavelength of a variable wavelength laser is measured by using an optical comb, and a feedback control is performed, whereby laser beams of plural predetermined wavelengths are obtained, or a variable wavelength laser is caused to oscillate at plural arbitrary wavelengths to obtain plural distance measurement values. The wavelengths (frequencies) of laser beams when the respective distance measurement values are obtained are measured by the optical comb, and used in calculation of the geometric distance. Plural lasers are used, and the geometric distance is obtained while the wavelengths of laser beams oscillated from the lasers are measured by the optical comb.
    Type: Grant
    Filed: July 29, 2009
    Date of Patent: February 5, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Kaoru Miyata
  • Patent number: 8081315
    Abstract: A laser interferometric measuring instrument includes: a light source that emits a laser beam of 1064 nm and another laser beam of 532 nm; a polarizing beam splitter; a dichroic mirror that splits a long-wavelength laser beam provided in a measurement optical path; a long-wavelength corner cube that reflects the split laser beam; a measurement corner cube that is displaceable along the measurement optical path; a reference corner cube that is displaceable along a reference optical path; a optical path changing unit that changes an optical path length of the long-wavelength laser beam; a phase detector that outputs interference signals; a sum signal computer that calculates a sum signal; a displacement controller that displaces the reference corner cube so as not to change a phase of the sum signal; a reference displacement detector that detects a displacement of the reference corner cube; and a measurement displacement computer that calculates a displacement of the measurement corner cube.
    Type: Grant
    Filed: July 23, 2009
    Date of Patent: December 20, 2011
    Assignee: Mitutoyo Corporation
    Inventor: Kaoru Miyata
  • Patent number: 7835411
    Abstract: A laser frequency stabilizing device comprises a laser light producer operative to produce and emit a laser light containing a first and a second longitudinal mode light having different wavelengths; a spectrometer operative to spectrally decompose the laser light into the first longitudinal mode light and the second longitudinal mode light; a first detector operative to detect the light output signal from a absorption cell; a second and third detector operative to detect the signal intensity of the first and second longitudinal mode light; an actuator operative to change the resonant cavity length; a first drive controller operative to detect the saturated absorption signal from the light output signal detected at the first detector and control driving the actuator based on the saturated absorption signal; a second drive controller operative to control driving the actuator such that the signal intensity of the first longitudinal mode light detected at the second detector and the signal intensity of the secon
    Type: Grant
    Filed: March 12, 2009
    Date of Patent: November 16, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Hiroki Masuda, Kaoru Miyata, Hisayoshi Sakai
  • Publication number: 20100027026
    Abstract: A laser interferometric measuring instrument includes: a light source that emits a laser beam of 1064 nm and another laser beam of 532 nm; a polarizing beam splitter; a dichroic mirror that splits a long-wavelength laser beam provided in a measurement optical path; a long-wavelength corner cube that reflects the split laser beam; a measurement corner cube that is displaceable along the measurement optical path; a reference corner cube that is displaceable along a reference optical path; a optical path changing unit that changes an optical path length of the long-wavelength laser beam; a phase detector that outputs interference signals; a sum signal computer that calculates a sum signal; a displacement controller that displaces the reference corner cube so as not to change a phase of the sum signal; a reference displacement detector that detects a displacement of the reference corner cube; and a measurement displacement computer that calculates a displacement of the measurement corner cube.
    Type: Application
    Filed: July 23, 2009
    Publication date: February 4, 2010
    Applicant: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata