Patents by Inventor Karen Avagyan

Karen Avagyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and systems for intelligent sampling of application traces
    Patent number: 11940895
    Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of trace types and/or frequency of occurrence of durations of the traces. Each sampling rate corresponds to a different trace type and/or different duration. The sampling rates for low frequency trace types and durations are larger than the sampling rates for high frequency trace types and durations. The relatively larger sampling rates for low frequency trace types and low frequency durations ensures that low frequency trace types and low frequency durations are sampled in sufficient numbers and are not passed over during sampling of the application traces. The set of sampled traces are stored in a data storage device.
    Type: Grant
    Filed: July 5, 2021
    Date of Patent: March 26, 2024
    Assignee: VMware LLC
    Inventors: Arnak Poghosyan, Ashot Nshan Harutyunyan, Naira Movses Grigoryan, Clement Pang, George Oganesyan, Karen Avagyan
  • METHODS AND SYSTEMS FOR INTELLIGENT SAMPLING OF NORMAL AND ERRONEOUS APPLICATION TRACES
    Publication number: 20220291982
    Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of normal traces and erroneous traces of the application. The sampling rates for low frequency normal and erroneous traces are larger than the sampling rates for high frequency normal and erroneous traces. The relatively larger sampling rates for low frequency trace ensures that low frequency traces are sampled in sufficient numbers and are not passed over during sampling of the application traces. The sampled normal and erroneous traces are stored in a data storage device.
    Type: Application
    Filed: July 13, 2021
    Publication date: September 15, 2022
    Applicant: VMware, Inc.
    Inventors: Arnak Poghosyan, Ashot Nshan Harutyunyan, Naira Movses Grigoryan, Clement Pang, George Oganesyan, Karen Avagyan
  • METHODS AND SYSTEMS FOR INTELLIGENT SAMPLING OF APPLICATION TRACES
    Publication number: 20220283924
    Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of trace types and/or frequency of occurrence of durations of the traces. Each sampling rate corresponds to a different trace type and/or different duration. The sampling rates for low frequency trace types and durations are larger than the sampling rates for high frequency trace types and durations. The relatively larger sampling rates for low frequency trace types and low frequency durations ensures that low frequency trace types and low frequency durations are sampled in sufficient numbers and are not passed over during sampling of the application traces. The set of sampled traces are stored in a data storage device.
    Type: Application
    Filed: July 5, 2021
    Publication date: September 8, 2022
    Applicant: VMware, Inc.
    Inventors: Arnak Poghosyan, Ashot Nshan Harutyunyan, Naira Movses Grigoryan, Clement Pang, George Oganesyan, Karen Avagyan