Patents by Inventor Karen Movsisyan

Karen Movsisyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Identifying failure mechanisms based on a population of scan diagnostic reports
    Patent number: 9703658
    Abstract: Systems and techniques for identifying failure mechanisms based on a population of scan diagnostic reports is described. Given a population of scan diagnostic reports, a mixed membership model can be used for computing a topic distribution for each portion of each scan diagnostic report and a feature distribution for each topic. The failure mechanisms can be identified based on the topic distributions for the portions of the scan diagnostic reports and the feature distributions for the topics.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: July 11, 2017
    Assignee: SYNOPSYS, INC.
    Inventors: Christopher W. Schuermyer, Karen Movsisyan
  • IDENTIFYING FAILURE MECHANISMS BASED ON A POPULATION OF SCAN DIAGNOSTIC REPORTS
    Publication number: 20170052861
    Abstract: Systems and techniques for identifying failure mechanisms based on a population of scan diagnostic reports is described. Given a population of scan diagnostic reports, a mixed membership model can be used for computing a topic distribution for each portion of each scan diagnostic report and a feature distribution for each topic. The failure mechanisms can be identified based on the topic distributions for the portions of the scan diagnostic reports and the feature distributions for the topics.
    Type: Application
    Filed: October 30, 2015
    Publication date: February 23, 2017
    Applicant: SYNOPSYS, INC.
    Inventors: Christopher W. Schuermyer, Karen Movsisyan
  • Extracting attribute fail rates from convoluted systems
    Patent number: 9454149
    Abstract: A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set of test results stored in memory; generating a yield model of the manufactured devices parsed by the set of attributes; populating the yield model based on the set of test results; and utilizing a processor to perform statistical analysis of the populated yield model to extract fail rates of the selected subset of attributes.
    Type: Grant
    Filed: April 28, 2013
    Date of Patent: September 27, 2016
    Assignee: Synopsys, Inc.
    Inventors: John Kim, Brian Gordon, Christophe Suzor, Karen Movsisyan
  • EXTRACTING ATTRIBUTE FAIL RATES FROM CONVOLUTED SYSTEMS
    Publication number: 20140324374
    Abstract: A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set of test results stored in memory; generating a yield model of the manufactured devices parsed by the set of attributes; populating the yield model based on the set of test results; and utilizing a processor to perform statistical analysis of the populated yield model to extract fail rates of the selected subset of attributes.
    Type: Application
    Filed: April 28, 2013
    Publication date: October 30, 2014
    Applicant: Synopsys Inc.
    Inventors: John Kim, Brian Gordon, Christophe Suzor, Karen Movsisyan