Abstract: A wiring analyzer system with a zero-insertion-force (ZIF) connector/receiver interface. An electrical connection is made by inserting a male connector into a female receiver slot. During insertion into the female receiver slot, the male connector experiences minimal, if any, resistive force. The female receiver comprises a set of opposing spring contacts designed to pinch both sides of the wafer, making contact with the male connector. A pair of elongated plates has several sections cut out to correspond with each female slot such that when the male connector is inserted between the spring contacts the wafer passes through both plates. In order to create the necessary pinching action, a force is exerted on the plates, causing them to move a distance in opposite directions. This motion brings the plates into contact with the spring contacts, squeezing them together against the wafer and creating a firm contact.

Abstract: A buckling beam probe contactor in which an array of electrically conductive, parallel, probe test wires, are cast into a housing with urethane or silicone elastomer so as to elastically couple the wires to each other and cause all of the probe wires to bend and buckle in identical, parallel, congruent waveforms and thereby maintain spacing between the wires. Stiffer elastomers are used to insure that the wires have a greater number of inflections with less sideways displacement. Various modifications of the elastomer allow desired buckling patterns to be generated.