Patents by Inventor Katrin Fuhrer

Katrin Fuhrer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8648294
    Abstract: Among other things, methods, systems, apparatus for performing on-the-fly apportionment are described. In particular, a mass spectrometry apparatus includes an ionization laser to produce a deionization laser beam. The apparatus also includes a particle beam path that receives aerosol particles and intersects the ionization laser beam at a location where aerosol particles are desorbed and ionized by the laser beam. The apparatus also includes an ion extractor located at or near the ionization location to separate positive ions and negative ions desorbed from the aerosol particles and to direct the positive ions along a first direction of an ion path and the negative ions along a second, opposite direction of the ion path. The apparatus also includes a first reflectron located at a first side of the ion extractor, on the ion path, to reflect the positive ions along a first reflection path that deviates from the ion path.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: February 11, 2014
    Assignee: The Regents of the University of California
    Inventors: Kimberly A. Prather, Joseph E. Mayer, Marc Gonin, Katrin Fuhrer
  • Patent number: 8492710
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: September 17, 2010
    Date of Patent: July 23, 2013
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Publication number: 20110303837
    Abstract: Among other things, methods, systems, apparatus for performing on-the-fly apportionment are described. In particular, a mass spectrometry apparatus includes an ionization laser to produce a deionization laser beam. The apparatus also includes a particle beam path that receives aerosol particles and intersects the ionization laser beam at a location where aerosol particles are desorbed and ionized by the laser beam. The apparatus also includes an ion extractor located at or near the ionization location to separate positive ions and negative ions desorbed from the aerosol particles and to direct the positive ions along a first direction of an ion path and the negative ions along a second, opposite direction of the ion path. The apparatus also includes a first reflectron located at a first side of the ion extractor, on the ion path, to reflect the positive ions along a first reflection path that deviates from the ion path.
    Type: Application
    Filed: October 17, 2007
    Publication date: December 15, 2011
    Applicant: The Regents of the University of California
    Inventors: Kimberly A. Prather, Joseph E. Mayer, Mark Gonin, Katrin Fuhrer
  • Patent number: 7935922
    Abstract: An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube.
    Type: Grant
    Filed: March 7, 2008
    Date of Patent: May 3, 2011
    Assignee: Tofwerk AG
    Inventors: Marc Gonin, Katrin Fuhrer
  • Publication number: 20110049355
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: September 17, 2010
    Publication date: March 3, 2011
    Applicant: IONWERKS, INC.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
  • Patent number: 7800054
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: September 21, 2010
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Publication number: 20090008545
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: April 25, 2008
    Publication date: January 8, 2009
    Applicant: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Publication number: 20080217528
    Abstract: An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube.
    Type: Application
    Filed: March 7, 2008
    Publication date: September 11, 2008
    Applicant: TOFWERK AG
    Inventors: Marc Gonin, Katrin Fuhrer
  • Publication number: 20080149825
    Abstract: An apparatus for mass analysis of ions comprises a high current ion source, in particular an ion source providing at least 5 million ions/s, preferably at least 50 million ions/s, at an output of the ion source, a time-of-flight mass spectrometer for analysis of ions transmitted from the ion source and a filter for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions. The filter is coupled to the ion source and the filter and the time-of-flight mass spectrometer are arranged in such a way that the ions of the first group are transmitted to the mass spectrometer and that the ions of the second group are not transmitted to the mass spectrometer. Furthermore, the filter is designed in such a way that the second group consists of ions belonging to one or several narrow bands of m/q. The apparatus allows for analyzing minor compound ions generated by the high current ion source with good selectivity, undisturbed by major compounds.
    Type: Application
    Filed: December 10, 2007
    Publication date: June 26, 2008
    Applicant: TOFWERK AG
    Inventors: Viatcheslav Ivanovich KOZLOVSKI, Katrin FUHRER, Marc GONIN
  • Patent number: 7365313
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: April 29, 2008
    Assignee: Ionwerks
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
  • Patent number: 7291834
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: November 6, 2007
    Assignee: Ionwerks, Inc.
    Inventors: Marc Gonin, Valeri V. Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully
  • Publication number: 20070018113
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Application
    Filed: September 1, 2006
    Publication date: January 25, 2007
    Applicant: Ionwerks, Inc.
    Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Schultz, Michael McCully
  • Patent number: 7164122
    Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.
    Type: Grant
    Filed: February 18, 2005
    Date of Patent: January 16, 2007
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, J. Albert Schultz
  • Patent number: 7145134
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: December 5, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully
  • Publication number: 20060192111
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: March 6, 2006
    Publication date: August 31, 2006
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas Egan, William Burton, J. Schultz, Valerie Vaughn, Steven Ulrich
  • Patent number: 7084393
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: November 25, 2003
    Date of Patent: August 1, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie Vaughn, Steven Ulrich
  • Patent number: 7084395
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Grant
    Filed: October 18, 2004
    Date of Patent: August 1, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas F. Egan, Michael I. McCully, J. Albert Schultz
  • Patent number: 7019286
    Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.
    Type: Grant
    Filed: October 20, 2003
    Date of Patent: March 28, 2006
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
  • Publication number: 20050189486
    Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.
    Type: Application
    Filed: February 18, 2005
    Publication date: September 1, 2005
    Inventors: Katrin Fuhrer, Marc Gonin, J. Schultz
  • Patent number: 6909090
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Grant
    Filed: August 11, 2003
    Date of Patent: June 21, 2005
    Assignee: Ionwerks
    Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully