Patents by Inventor Katrin Fuhrer
Katrin Fuhrer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8648294Abstract: Among other things, methods, systems, apparatus for performing on-the-fly apportionment are described. In particular, a mass spectrometry apparatus includes an ionization laser to produce a deionization laser beam. The apparatus also includes a particle beam path that receives aerosol particles and intersects the ionization laser beam at a location where aerosol particles are desorbed and ionized by the laser beam. The apparatus also includes an ion extractor located at or near the ionization location to separate positive ions and negative ions desorbed from the aerosol particles and to direct the positive ions along a first direction of an ion path and the negative ions along a second, opposite direction of the ion path. The apparatus also includes a first reflectron located at a first side of the ion extractor, on the ion path, to reflect the positive ions along a first reflection path that deviates from the ion path.Type: GrantFiled: October 17, 2007Date of Patent: February 11, 2014Assignee: The Regents of the University of CaliforniaInventors: Kimberly A. Prather, Joseph E. Mayer, Marc Gonin, Katrin Fuhrer
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Patent number: 8492710Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: GrantFiled: September 17, 2010Date of Patent: July 23, 2013Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
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Publication number: 20110303837Abstract: Among other things, methods, systems, apparatus for performing on-the-fly apportionment are described. In particular, a mass spectrometry apparatus includes an ionization laser to produce a deionization laser beam. The apparatus also includes a particle beam path that receives aerosol particles and intersects the ionization laser beam at a location where aerosol particles are desorbed and ionized by the laser beam. The apparatus also includes an ion extractor located at or near the ionization location to separate positive ions and negative ions desorbed from the aerosol particles and to direct the positive ions along a first direction of an ion path and the negative ions along a second, opposite direction of the ion path. The apparatus also includes a first reflectron located at a first side of the ion extractor, on the ion path, to reflect the positive ions along a first reflection path that deviates from the ion path.Type: ApplicationFiled: October 17, 2007Publication date: December 15, 2011Applicant: The Regents of the University of CaliforniaInventors: Kimberly A. Prather, Joseph E. Mayer, Mark Gonin, Katrin Fuhrer
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Patent number: 7935922Abstract: An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube.Type: GrantFiled: March 7, 2008Date of Patent: May 3, 2011Assignee: Tofwerk AGInventors: Marc Gonin, Katrin Fuhrer
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Publication number: 20110049355Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: ApplicationFiled: September 17, 2010Publication date: March 3, 2011Applicant: IONWERKS, INC.Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
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Patent number: 7800054Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: GrantFiled: April 25, 2008Date of Patent: September 21, 2010Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
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Publication number: 20090008545Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: ApplicationFiled: April 25, 2008Publication date: January 8, 2009Applicant: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
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Publication number: 20080217528Abstract: An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube.Type: ApplicationFiled: March 7, 2008Publication date: September 11, 2008Applicant: TOFWERK AGInventors: Marc Gonin, Katrin Fuhrer
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Publication number: 20080149825Abstract: An apparatus for mass analysis of ions comprises a high current ion source, in particular an ion source providing at least 5 million ions/s, preferably at least 50 million ions/s, at an output of the ion source, a time-of-flight mass spectrometer for analysis of ions transmitted from the ion source and a filter for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions. The filter is coupled to the ion source and the filter and the time-of-flight mass spectrometer are arranged in such a way that the ions of the first group are transmitted to the mass spectrometer and that the ions of the second group are not transmitted to the mass spectrometer. Furthermore, the filter is designed in such a way that the second group consists of ions belonging to one or several narrow bands of m/q. The apparatus allows for analyzing minor compound ions generated by the high current ion source with good selectivity, undisturbed by major compounds.Type: ApplicationFiled: December 10, 2007Publication date: June 26, 2008Applicant: TOFWERK AGInventors: Viatcheslav Ivanovich KOZLOVSKI, Katrin FUHRER, Marc GONIN
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Patent number: 7365313Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: GrantFiled: March 6, 2006Date of Patent: April 29, 2008Assignee: IonwerksInventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
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Patent number: 7291834Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.Type: GrantFiled: September 1, 2006Date of Patent: November 6, 2007Assignee: Ionwerks, Inc.Inventors: Marc Gonin, Valeri V. Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully
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Publication number: 20070018113Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.Type: ApplicationFiled: September 1, 2006Publication date: January 25, 2007Applicant: Ionwerks, Inc.Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Schultz, Michael McCully
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Patent number: 7164122Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.Type: GrantFiled: February 18, 2005Date of Patent: January 16, 2007Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, J. Albert Schultz
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Patent number: 7145134Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.Type: GrantFiled: May 28, 2004Date of Patent: December 5, 2006Assignee: Ionwerks, Inc.Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully
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Publication number: 20060192111Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: ApplicationFiled: March 6, 2006Publication date: August 31, 2006Inventors: Katrin Fuhrer, Marc Gonin, Thomas Egan, William Burton, J. Schultz, Valerie Vaughn, Steven Ulrich
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Patent number: 7084393Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.Type: GrantFiled: November 25, 2003Date of Patent: August 1, 2006Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie Vaughn, Steven Ulrich
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Patent number: 7084395Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.Type: GrantFiled: October 18, 2004Date of Patent: August 1, 2006Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas F. Egan, Michael I. McCully, J. Albert Schultz
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Patent number: 7019286Abstract: Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.Type: GrantFiled: October 20, 2003Date of Patent: March 28, 2006Assignee: Ionwerks, Inc.Inventors: Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas Egan, Michael I. McCully, John A. Schultz
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Publication number: 20050189486Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.Type: ApplicationFiled: February 18, 2005Publication date: September 1, 2005Inventors: Katrin Fuhrer, Marc Gonin, J. Schultz
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Patent number: 6909090Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.Type: GrantFiled: August 11, 2003Date of Patent: June 21, 2005Assignee: IonwerksInventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully