Patents by Inventor Katsuhiko Mieda

Katsuhiko Mieda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe
    Patent number: 7076883
    Abstract: A scanning probe (1, 10) according to the present invention includes a measurement stylus (stylus) (6) movably supported via elastic members (5D, 5E, 5F) on a probe body (4), fine feeders (3, 7) for moving the probe body (4) and the measurement stylus (6) against a workpiece within a fine range, a contacting force detector (5G) for detecting a contacting force between the measurement stylus (6) and a surface of the workpiece, and a contacting force adjuster (8) for adjusting the contacting force by removing the inertial force acting to the measurement stylus (6) because of acceleration from the contacting force. Because of this feature, a measuring force can be adjusted by providing feedback controls to the fine feeders (3, 7), so that the tracking capability is ensured to provide a high response rate and high precision in measurement.
    Type: Grant
    Filed: July 26, 2004
    Date of Patent: July 18, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Yamamoto, Takenori Akaike, Katsuhiko Mieda
  • Scanning probe
    Publication number: 20050022409
    Abstract: A scanning probe (1, 10) according to the present invention includes a measurement stylus (stylus) (6) movably supported via elastic members (5D, 5E, 5F) on a probe body (4), fine feeders (3, 7) for moving the probe body (4) and the measurement stylus (6) against a workpiece within a fine range, a contacting force detector (5G) for detecting a contacting force between the measurement stylus (6) and a surface of the workpiece, and a contacting force adjuster (8) for adjusting the contacting force by removing the inertial force acting to the measurement stylus (6) because of acceleration from the contacting force. Because of this feature, a measuring force can be adjusted by providing feedback controls to the fine feeders (3, 7), so that the tracking capability is ensured to provide a high response rate and high precision in measurement.
    Type: Application
    Filed: July 26, 2004
    Publication date: February 3, 2005
    Applicant: MITUTOYO CORPORATION
    Inventors: Takeshi Yamamoto, Takenori Akaike, Katsuhiko Mieda