Abstract: A memory device testing apparatus transfers at high speed a fail signal from a failure analysis memory unit 100 to a memory failure remedy analysis unit 200. The failure analysis memory unit 100 has a data storage memory 110 and a compact memory 120. The data storage memory 110 is divided into at least two sub address spaces. The divided sub address spaces are assigned to the addresses in the compact memory 120. A address generation control unit reads data stored in the compact memory 120. An address generation unit 132 generates a memory address signal 143 based on a sub address signal 141 and a detail address signal 142. The detail address signal 142 is incremented by the address generation control unit 125. The data in the sub address space storing the fail signal is transferred to the memory failure remedy analysis unit 200. If the data read from the compact memory 120 does not contain failure information, the data stored in the corresponding sub address space is not transferred.

Abstract: A memory device testing apparatus transfers at high speed a fail signal from a failure analysis memory unit 100 to a memory failure remedy analysis unit 200. The failure analysis memory unit 100 has a data storage memory 110 and a compact memory 120. The data storage memory 110 is divided into at least two sub address spaces. The divided sub address spaces are assigned to the addresses in the compact memory 120. An address generation control unit reads data stored in the compact memory 120. An address generation unit 132 generates a memory address signal 143 based on a sub address signal 141 and a detail address signal 142. The detail address signal 142 is incremented by the address generation control unit 125. The data in the sub address space storing the fail signal is transferred to the memory failure remedy analysis unit 200. If the data read from the compact memory 120 does not contain failure information, the data stored in the corresponding sub address space is not transferred.

Abstract: Output data from memories under test and expectation data are compared by logic comparators, then the comparison results are input as fail data into fail data compressing/bit positions, and the data are compressed in the data-width direction into one-bit data displaced apart in bit position. When a control signal is “1,” hey are stored in a memory section at corresponding bit positions. When the control signal is “0,” the fail data from one logic comparator is stored intact in the memory part.

Abstract: An optical element comprising at least a plurality of pixels formed on a substrate and partition walls arranged respectively between adjacent pixels is manufactured by a method comprising steps of forming partition walls of a resin composition on a substrate, performing a dry etching process of irradiating the substrate carrying the partition walls formed thereon with plasma in an atmosphere containing gas selected at least from oxygen, argon and helium, performing a plasma treatment process of irradiating the substrate subjected to the dry etching process with plasma in an atmosphere containing at least fluorine atoms, and forming pixels by applying ink to the areas surrounding by the partition walls by means of an ink-jet system.

Abstract: In a method of manufacturing a color filter, an ink-jet head discharges ink onto a substrate formed on a surface of an ink receiving layer and colors each pixel of the color filter. The ink-jet head discharges ink onto the position of each pixel by using an alignment mark as a reference which is formed on the ink receiving layer.

Abstract: A magneto-optical recording medium comprises a substrate and provided thereon a magneto-optical recording layer and a protective resin layer, a magnetic field being applied to the magneto-optical recording layer from the side of the protective layer by a magnetic-field generating means, and the recording layer being irradiated with a light beam through the substrate to record information. The protective layer has a first surface confronting the magnetic-field generating means and a second surface confronting the recording layer, and the protective layer has a surface resistivity of 1.times.10.sup.10 .OMEGA./.quadrature. or less on the first surface and has a region with a thermal conductivity of 10 W/m.multidot.K or less, extending from the second surface toward the first surface.

Abstract: There is disclosed an optical recording medium provided with an optical recording layer on a substrate, in which a layer of nitride of a substance selected from tungsten, zirconium, titanium, niobium, vanadium, tantalum and chromium is formed on a side or both sides of the optical recording layer.

Abstract: In an optical recording medium having an optical recording layer provided on a substrate, a carbide film of a substance selected from among tungsten, boron, molybdenum, hafnium, niobium, titanium, chromium, vanadium, tantalum and silicon is formed on one or each side of the recording layer.

Abstract: A magnetic recording medium comprising a substrate, a magnetic recording layer made of an amorphous magnetic film on the substrate, and an anticorrosive layer prepared by oxidation treatment of the surface of the amorphous magnetic film.

Abstract: An optical recording medium comprises a plurality of layers including an optical recording layer laminated on the substrate, said substrate having a region on and around the edge portion thereof where no optical recording layer is formed, and said region being sealed by any of said layers other than said optical recording layer.

Abstract: A recording medium comprising a substrate, a recording layer formed thereupon, and an anticorrosive layer which covers the recording layer and contains a chemical to prevent the corrosion of the recording layer.

Abstract: A recording medium is provided which comprises (a) a first recording layer; (b) a second recording layer provided in contiguity to the first recording layer; and (c) a separation layer for spatially separating the first and second recording layer. The first recording layer has a sufficient film thickness not to permit the recording to be effected on the second recording layer, while the recording operation is performed on the first recording layer, and the recording operation is effected on the second recording layer at positions corresponding to defective portions in the first recording layer.