Patents by Inventor Katsuya Sangu

Katsuya Sangu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6870952
    Abstract: The Xray irradiation device 1 issues Xrays to board mark 7 and projects the image of the board mark 7 on the fluorescence screen 3, the fluorescence face 39 of which visibly displays the image of the board mark 7 that can be captured by the CCD camera 2. The CCD camera 2 images the board mark 7 and the mask mark 5 depicted on the photo mask 4 overlapping together. The board 6 and the photo mask 4 are aligned by exposure stage 8 so as to the board mark 7 and the mask mark 5 coincide.
    Type: Grant
    Filed: March 12, 2001
    Date of Patent: March 22, 2005
    Assignee: Adtec Engineering Co., Ltd.
    Inventors: Katsuya Sangu, Ryoichi Ida, Katsumi Momose, Michitomo Koda
  • Patent number: 6597757
    Abstract: A marking apparatus for forming alignment marks, which improves the alignment accuracy of each layer in the production of multi-layered printed circuit boards. An X-ray generator 11 irradiates X-rays at a standard mark 50 in a core board 51 of a board 5, and projects the image of the standard mark 50 on a fluorescence screen 12. The image is captured by a visible light CCD camera 13, thereby the position of the standard mark 50 is detected. Using the detected position of the standard mark 50 as an alignment reference, the apparatus irradiates ultra-violet rays at dry film resist layers 55 via mirrors 22 and 23, and imprints the marks emerged on photo masks 24 and 25 on the dry film resist layers 55, respectively.
    Type: Grant
    Filed: October 8, 2002
    Date of Patent: July 22, 2003
    Assignee: Adtec Engineering Co., Ltd.
    Inventors: Ryoichi Ida, Katsuya Sangu, Katsumi Momose, Wataru Nakagawa
  • Publication number: 20030081719
    Abstract: A marking apparatus for forming alignment marks, which improves the alignment accuracy of each layer in the production of multi-layered printed circuit boards. An X-ray generator 11 irradiates X-rays at a standard mark 50 in a core board 51 of a board 5, and projects the image of the standard mark 50 on a fluorescence screen 12. The image is captured by a visible light CCD camera 13, thereby the position of the standard mark 50 is detected. Using the detected position of the standard mark 50 as an alignment reference, the apparatus irradiates ultra-violet rays at dry film resist layers 55 via mirrors 22 and 23, and imprints the marks emerged on photo masks 24 and 25 on the dry film resist layers 55, respectively.
    Type: Application
    Filed: October 8, 2002
    Publication date: May 1, 2003
    Inventors: Ryoichi Ida, Katsuya Sangu, Katsumi Momose, Wataru Nakagawa
  • Publication number: 20010026638
    Abstract: The Xray irradiation device 1 issues Xrays to board mark 7 and projects the image of the board mark 7 on the fluorescence screen 3, the fluorescence face 39 of which visibly displays the image of the board mark 7 that can be captured by the CCD camera 2. The CCD camera 2 images the board mark 7 and the mask mark 5 depicted on the photo mask 4 overlapping together. The board 6 and the photo mask 4 are aligned by exposure stage 8 so as to the board mark 7 and the mask mark 5 coincide.
    Type: Application
    Filed: March 12, 2001
    Publication date: October 4, 2001
    Inventors: Katsuya Sangu, Ryoichi Ida, Katsumi Mamose, Michitomo Koda
  • Patent number: 6252649
    Abstract: The invention is to provide an aligner which may produce the printed circuit works having no defects due to the incomplete alignment of the film-mask and the work, wherein the film-mask F having aligning marks 3 and the work K having aligning marks 4 are closely contacted with each other, and then the aligned conditions of the aligning marks 3 and 4 are detected, if the aligned conditions are detected to be out of the range of a predetermined tolerance, the close contact of the film-mask F and the work K is canceled, and the same aligning operation is repeated until the aligned conditions are detected to be within the range of a predetermined tolerance, so that the products of inferior quality may be prevented from being produced due to the incomplete alignment.
    Type: Grant
    Filed: February 2, 1999
    Date of Patent: June 26, 2001
    Assignees: Adtec Engineering Co., Ltd., Canon Components, Inc.
    Inventor: Katsuya Sangu