Abstract: A scroll compressor comprising a fixed scroll (15); an orbiting scroll (16) supported in a manner allowing for orbiting motion; a discharge port through which a fluid compressed by the two scrolls (15, 16) is discharged; an end plate step portion (16E) provided on an end plate of the orbiting scroll (16) formed so that a height of the end plate is higher on a center portion side in the direction of a spiral wrap and lower on an outer end side; and a wrap step portion (15E) provided on a wall portion of the fixed scroll (15) that corresponds to the end plate step portion (16E) so that a height of the wall portion is lower on the center portion side of the spiral and higher on the outer end side; wherein the orbiting scroll (16) is treated for surface hardening and the fixed scroll (15) is not treated for surface hardening.

Abstract: The present disclosure relates to a solid-state imaging device that makes it possible to suppress deterioration of phase difference information, and an electronic device. There is provided a solid-state imaging device including a pixel array unit in which a plurality of pixels is two-dimensionally arrayed. The plurality of pixels includes a phase difference pixel for phase difference detection, the pixel array unit has an array pattern in which pixel units including neighboring pixels of a same color are regularly arrayed, and the phase difference pixel is partially not added when horizontal/vertical addition is performed on a pixel signal of a predetermined pixel in a horizontal direction and a pixel signal of a predetermined pixel in a vertical direction, in reading the plurality of pixels. The present disclosure can be applied to, for example, a CMOS image sensor having a phase difference pixel.

Abstract: The present disclosure relates to a solid-state imaging device that makes it possible to suppress deterioration of phase difference information, and an electronic device. There is provided a solid-state imaging device including a pixel array unit in which a plurality of pixels is two-dimensionally arrayed. The plurality of pixels includes a phase difference pixel for phase difference detection, the pixel array unit has an array pattern in which pixel units including neighboring pixels of a same color are regularly arrayed, and the phase difference pixel is partially not added when horizontal/vertical addition is performed on a pixel signal of a predetermined pixel in a horizontal direction and a pixel signal of a predetermined pixel in a vertical direction, in reading the plurality of pixels. The present disclosure can be applied to, for example, a CMOS image sensor having a phase difference pixel.

Abstract: The present technology relates to an image processing device, an image processing method, and an image processing system capable of improving detection accuracy of a defective pixel. Provided is an image processing device including a defective pixel estimation unit that estimates a defect of a pixel of interest in an image captured by a solid-state imaging device that contains a two-dimensional array of color pixels, and high-sensitivity pixels having higher sensitivity than sensitivities of the color pixels. The defect of the pixel of interest is estimated on the basis of a correlation between pixel values of the high-sensitivity pixels, and pixel values of the color pixels. The image processing device further includes a defective pixel correction unit that corrects the pixel of interest when it is estimated that the pixel of interest is a defective pixel. The present technology is applicable to an image processing device which corrects a defective pixel by signal processing, for example.

Abstract: The present technology relates to an image processing device, an image processing method, and an image processing system capable of improving detection accuracy of a defective pixel. Provided is an image processing device including a defective pixel estimation unit that estimates a defect of a pixel of interest in an image captured by a solid-state imaging device that contains a two-dimensional array of color pixels, and high-sensitivity pixels having higher sensitivity than sensitivities of the color pixels. The defect of the pixel of interest is estimated on the basis of a correlation between pixel values of the high-sensitivity pixels, and pixel values of the color pixels. The image processing device further includes a defective pixel correction unit that corrects the pixel of interest when it is estimated that the pixel of interest is a defective pixel. The present technology is applicable to an image processing device which corrects a defective pixel by signal processing, for example.

Abstract: A solid-state imaging device includes a pixel array and a pixel value correcting unit. The pixel array includes a plurality of pixels, the plurality of pixels each having one of a different exposure time and a different exposure sensitivity and being disposed according to a predetermined rule. The pixel value correcting unit is configured to correct, among pixel values obtained from the plurality of pixels in the pixel array, a pixel value of a pixel of the plurality of pixels that applies to a preset condition, by using a pixel value of another pixel of the plurality of pixels.

Abstract: A solid-state imaging device includes a pixel array and a pixel value correcting unit. The pixel array includes a plurality of pixels, the plurality of pixels each having one of a different exposure time and a different exposure sensitivity and being disposed according to a predetermined rule. The pixel value correcting unit is configured to correct, among pixel values obtained from the plurality of pixels in the pixel array, a pixel value of a pixel of the plurality of pixels that applies to a preset condition, by using a pixel value of another pixel of the plurality of pixels.

Abstract: A solid-state imaging device includes a pixel array and a pixel value correcting unit. The pixel array includes a plurality of pixels, the plurality of pixels each having one of a different exposure time and a different exposure sensitivity and being disposed according to a predetermined rule. The pixel value correcting unit is configured to correct, among pixel values obtained from the plurality of pixels in the pixel array, a pixel value of a pixel of the plurality of pixels that applies to a preset condition, by using a pixel value of another pixel of the plurality of pixels.

Abstract: A solid-state imaging device includes a pixel array and a pixel value correcting unit. The pixel array includes a plurality of pixels, the plurality of pixels each having one of a different exposure time and a different exposure sensitivity and being disposed according to a predetermined rule. The pixel value correcting unit is configured to correct, among pixel values obtained from the plurality of pixels in the pixel array, a pixel value of a pixel of the plurality of pixels that applies to a preset condition, by using a pixel value of another pixel of the plurality of pixels.

Abstract: Disclosed herein is an image processing apparatus including an interlace/progressive conversion section configured to carry out interpolation processing on image data of the current field by making use of the image data of the current field and image data of a field leading ahead of the current field by one field period in order to obtain image data of a progressive system with no delay time.

Abstract: Disclosed herein is an image processing apparatus including an interlace/progressive conversion section configured to carry out interpolation processing on image data of the current field by making use of the image data of the current field and image data of a field leading ahead of the current field by one field period in order to obtain image data of a progressive system with no delay time.

Abstract: A image processing apparatus includes an interlace/progressive converter that converts interlaced input image data into progressive image data; an up-convert material detector that detects low quality up-convert material likelihood of the interlaced input image data; and an image processor that obtains output image data by processing progressive image data on the basis of the detected signal of the up-convert material detector, wherein the up-convert material detector detects the low quality up-convert material likelihood on the basis of ratio of the sum of an inter-field pixel value difference and the sum of in-field pixel value difference, the pixels in a predetermined area being obtained as sequential notable pixels using image data of a first field and a second field that are continuous in each field.

Abstract: A image processing apparatus includes an interlace/progressive converter that converts interlaced input image data into progressive image data; an up-convert material detector that detects low quality up-convert material likelihood of the interlaced input image data; and an image processor that obtains output image data by processing progressive image data on the basis of the detected signal of the up-convert material detector, wherein the up-convert material detector detects the low quality up-convert material likelihood on the basis of ratio of the sum of an inter-field pixel value difference and the sum of in-field pixel value difference, the pixels in a predetermined area being obtained as sequential notable pixels using image data of a first field and a second field that are continuous in each field.

Abstract: An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.

Abstract: An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.

Abstract: A probe structure for measuring electric characteristics of a semiconductor element containing a first electrically conductive circuit board having a structure wherein the contact portions, which are contacted with the terminals of a material to be tested, are disposed in a first insulator in the direction of the thickness thereof so as to penetrate the insulator and are connected to a first electrically conductive wiring formed between the first insulator and a second insulator. The probe structure also contains a second electrically conductive circuit board having a coefficient of thermal expansion which is the same as or similar to that of the material to be tested and having a structure wherein the first electrically conductive wiring is connected to a second electrically conductive wiring which, in turn, is connected to an electric tester for testing the electric characteristics of the material to be tested.

Abstract: An intra-ocular lens comprising a lens part and a fixing part for fixing the lens part in an eye, the lens part comprising a colorless and transparent polyimide containing at least one of repeating units represented by formulae (I) to (IV): ##STR1## wherein X.sub.1 represents ##STR2## X.sub.2 represents ##STR3## X.sub.3 represents ##STR4## Further, the lens part and the fixing part may be integrally molded together, if desired.