Patents by Inventor Kazushige NISHIMURA
Kazushige NISHIMURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10684256Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.Type: GrantFiled: February 28, 2017Date of Patent: June 16, 2020Assignee: Hitachi High-Tech CorporationInventors: Hiroyuki Satake, Kazushige Nishimura, Hideki Hasegawa, Masuyuki Sugiyama
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Patent number: 10551346Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.Type: GrantFiled: August 19, 2016Date of Patent: February 4, 2020Assignee: Hitachi High-Technologies CorporationInventors: Kazushige Nishimura, Masuyuki Sugiyama, Hideki Hasegawa, Yuichiro Hashimoto
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Patent number: 10466214Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.Type: GrantFiled: December 9, 2015Date of Patent: November 5, 2019Assignee: HITACHI, LTD.Inventors: Masako Ishimaru, Masao Kamahori, Masuyuki Sugiyama, Kazushige Nishimura, Hiroyuki Satake, Hideki Hasegawa
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Patent number: 10431445Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.Type: GrantFiled: October 9, 2015Date of Patent: October 1, 2019Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Kazushige Nishimura, Hiroyuki Satake, Masuyuki Sugiyama, Hideki Hasegawa, Tomoyuki Sakai
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Publication number: 20190178841Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.Type: ApplicationFiled: August 19, 2016Publication date: June 13, 2019Inventors: Kazushige NISHIMURA, Masuyuki SUGIYAMA, Hideki HASEGAWA, Yuichiro HASHIMOTO
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Publication number: 20190079051Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.Type: ApplicationFiled: February 28, 2017Publication date: March 14, 2019Inventors: Hiroyuki SATAKE, Kazushige NISHIMURA, Hideki HASEGAWA, Masuyuki SUGIYAMA
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Publication number: 20180286658Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.Type: ApplicationFiled: October 9, 2015Publication date: October 4, 2018Inventors: Kazushige NISHIMURA, Hiroyuki SATAKE, Masuyuki SUGIYAMA, Hideki HASEGAWA, Tomoyuki SAKAI
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Publication number: 20180284083Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.Type: ApplicationFiled: December 9, 2015Publication date: October 4, 2018Inventors: Masako ISHIMARU, Masao KAMAHORI, Masuyuki SUGIYAMA, Kazushige NISHIMURA, Hiroyuki SATAKE, Hideki HASEGAWA
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Patent number: 9601321Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.Type: GrantFiled: June 14, 2013Date of Patent: March 21, 2017Assignee: Hitachi High-Technologies CorporationInventors: Akihito Kaneko, Yohei Kawaguchi, Masuyuki Sugiyama, Kazushige Nishimura
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Patent number: 9543135Abstract: A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.Type: GrantFiled: July 31, 2012Date of Patent: January 10, 2017Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Shun Kumano, Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada, Kazushige Nishimura, Hidetoshi Morokuma
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Patent number: 9287105Abstract: There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.Type: GrantFiled: February 6, 2013Date of Patent: March 15, 2016Assignee: Hitachi High-Technologies CorporationInventors: Yohei Kawaguchi, Yuichiro Hashimoto, Masuyuki Sugiyama, Shun Kumano, Akihito Kaneko, Masahito Togami, Kazushige Nishimura, Hiroyuki Inoue
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Publication number: 20150206728Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.Type: ApplicationFiled: June 14, 2013Publication date: July 23, 2015Applicant: Hitachi High-Technologies CorporationInventors: Akihito Kaneko, Yohei Kawaguchi, Masuyuki Sugiyama, Kazushige Nishimura
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Patent number: 8803084Abstract: A mass spectrometer featured in including an ion source including a first electrode, a second electrode, and a dielectric unit having a sample introducing unit and a sample discharging unit and provided between the first electrode and the second electrode, a power source of ionizing a sample by a discharge generated between the first electrode and the second electrode by applying an alternating current voltage to either one of the first electrode and the second electrode, a mass spectrometry unit of analyzing an ion discharged from the sample discharging unit, and a light irradiating unit of irradiating an area of generating the discharge with light.Type: GrantFiled: December 24, 2012Date of Patent: August 12, 2014Assignee: Hitachi High-Technologies CorporationInventors: Kazushige Nishimura, Yuichiro Hashimoto, Masuyuki Sugiyama, Masuyoshi Yamada, Hidetoshi Morokuma
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Publication number: 20130228677Abstract: There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.Type: ApplicationFiled: February 6, 2013Publication date: September 5, 2013Applicant: Hitachi High-Technologies CorporationInventors: Yohei KAWAGUCHI, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA, Shun KUMANO, Akihito KANEKO, Masahito TOGAMI, Kazushige NISHIMURA, Hiroyuki INOUE
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Publication number: 20130048851Abstract: A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.Type: ApplicationFiled: July 31, 2012Publication date: February 28, 2013Inventors: Shun KUMANO, Masuyuki SUGIYAMA, Yuichiro HASHIMOTO, Hideki HASEGAWA, Masuyoshi YAMADA, Kazushige NISHIMURA, Hidetoshi MOROKUMA