Patents by Inventor Kazushige NISHIMURA

Kazushige NISHIMURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10684256
    Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.
    Type: Grant
    Filed: February 28, 2017
    Date of Patent: June 16, 2020
    Assignee: Hitachi High-Tech Corporation
    Inventors: Hiroyuki Satake, Kazushige Nishimura, Hideki Hasegawa, Masuyuki Sugiyama
  • Patent number: 10551346
    Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.
    Type: Grant
    Filed: August 19, 2016
    Date of Patent: February 4, 2020
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kazushige Nishimura, Masuyuki Sugiyama, Hideki Hasegawa, Yuichiro Hashimoto
  • Patent number: 10466214
    Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.
    Type: Grant
    Filed: December 9, 2015
    Date of Patent: November 5, 2019
    Assignee: HITACHI, LTD.
    Inventors: Masako Ishimaru, Masao Kamahori, Masuyuki Sugiyama, Kazushige Nishimura, Hiroyuki Satake, Hideki Hasegawa
  • Patent number: 10431445
    Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.
    Type: Grant
    Filed: October 9, 2015
    Date of Patent: October 1, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kazushige Nishimura, Hiroyuki Satake, Masuyuki Sugiyama, Hideki Hasegawa, Tomoyuki Sakai
  • Publication number: 20190178841
    Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.
    Type: Application
    Filed: August 19, 2016
    Publication date: June 13, 2019
    Inventors: Kazushige NISHIMURA, Masuyuki SUGIYAMA, Hideki HASEGAWA, Yuichiro HASHIMOTO
  • Publication number: 20190079051
    Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.
    Type: Application
    Filed: February 28, 2017
    Publication date: March 14, 2019
    Inventors: Hiroyuki SATAKE, Kazushige NISHIMURA, Hideki HASEGAWA, Masuyuki SUGIYAMA
  • Publication number: 20180286658
    Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.
    Type: Application
    Filed: October 9, 2015
    Publication date: October 4, 2018
    Inventors: Kazushige NISHIMURA, Hiroyuki SATAKE, Masuyuki SUGIYAMA, Hideki HASEGAWA, Tomoyuki SAKAI
  • Publication number: 20180284083
    Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.
    Type: Application
    Filed: December 9, 2015
    Publication date: October 4, 2018
    Inventors: Masako ISHIMARU, Masao KAMAHORI, Masuyuki SUGIYAMA, Kazushige NISHIMURA, Hiroyuki SATAKE, Hideki HASEGAWA
  • Patent number: 9601321
    Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.
    Type: Grant
    Filed: June 14, 2013
    Date of Patent: March 21, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akihito Kaneko, Yohei Kawaguchi, Masuyuki Sugiyama, Kazushige Nishimura
  • Patent number: 9543135
    Abstract: A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: January 10, 2017
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Shun Kumano, Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada, Kazushige Nishimura, Hidetoshi Morokuma
  • Patent number: 9287105
    Abstract: There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: March 15, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yohei Kawaguchi, Yuichiro Hashimoto, Masuyuki Sugiyama, Shun Kumano, Akihito Kaneko, Masahito Togami, Kazushige Nishimura, Hiroyuki Inoue
  • Publication number: 20150206728
    Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.
    Type: Application
    Filed: June 14, 2013
    Publication date: July 23, 2015
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Akihito Kaneko, Yohei Kawaguchi, Masuyuki Sugiyama, Kazushige Nishimura
  • Patent number: 8803084
    Abstract: A mass spectrometer featured in including an ion source including a first electrode, a second electrode, and a dielectric unit having a sample introducing unit and a sample discharging unit and provided between the first electrode and the second electrode, a power source of ionizing a sample by a discharge generated between the first electrode and the second electrode by applying an alternating current voltage to either one of the first electrode and the second electrode, a mass spectrometry unit of analyzing an ion discharged from the sample discharging unit, and a light irradiating unit of irradiating an area of generating the discharge with light.
    Type: Grant
    Filed: December 24, 2012
    Date of Patent: August 12, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kazushige Nishimura, Yuichiro Hashimoto, Masuyuki Sugiyama, Masuyoshi Yamada, Hidetoshi Morokuma
  • Publication number: 20130228677
    Abstract: There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.
    Type: Application
    Filed: February 6, 2013
    Publication date: September 5, 2013
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Yohei KAWAGUCHI, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA, Shun KUMANO, Akihito KANEKO, Masahito TOGAMI, Kazushige NISHIMURA, Hiroyuki INOUE
  • Publication number: 20130048851
    Abstract: A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.
    Type: Application
    Filed: July 31, 2012
    Publication date: February 28, 2013
    Inventors: Shun KUMANO, Masuyuki SUGIYAMA, Yuichiro HASHIMOTO, Hideki HASEGAWA, Masuyoshi YAMADA, Kazushige NISHIMURA, Hidetoshi MOROKUMA