Abstract: In an outdoor unit of a refrigeration apparatus is a blow-out opening configured to deliver air from an air-blowing fan that is covered by a protective grill. The outdoor unit includes an eave part protruding in a direction along which the air is blown out from a top part of the grill. A top surface of the eave part has a water-leading part extending in a direction intersecting the direction along which the air is blown out. The water-leading part leads water dripping down onto the top surface of the eave part to at least one of longitudinal ends of the eave part and a middle of the eave part.

Abstract: In an outdoor unit of a refrigeration apparatus is a blow-out opening configured to deliver air from an air-blowing fan that is covered by a protective grill. The outdoor unit includes an eave part protruding in a direction along which the air is blown out from a top part of the grill. A top surface of the eave part has a water-leading part extending in a direction intersecting the direction along which the air is blown out. The water-leading part leads water dripping down onto the top surface of the eave part to at least one of longitudinal ends of the eave part and a middle of the eave part.

Abstract: An integrated circuit of a quadrature modulator comprising a baseband section implementing .pi./4 shift QPSK having a simple test circuit is disclosed. The baseband section comprises: an impulse response memory having memory cells each storing a cell data representing a value of impulse response sequence for a impulse response function; and an adder for convolution integral implementing convolution summer from the cell data. The quadrature modulator operates for testing the cell data of the memory cells of the impulse response memory when supplied with a test instruction signal. The test is carried out by reading out whole the memory cells of the impulse response memory and adding in the adder for convolution integral the cell data read out from whole the memory cells. The number of I/O terminals for carrying out the test for the impulse response memory and the chip size of the integrated circuit are reduced.