Patents by Inventor Keiro Muro
Keiro Muro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240111930Abstract: A system determines a plurality of model classes of a scenario model based on: different factors with respect to a scenario model for a digital twin simulator, the factors being specified from physical or digital asset; and a result of comparison between a value for the factor and a threshold of each factor. For each of the model classes and for each outcome with respect to the scenario model, the system receives, from a user, an outcome value range that is a range of a value of the each outcome and is a range of a value based on heuristics. The system prepares, for each model class, a scenario model having an outcome value belonging to the outcome value range received for the each model class. The system selects an optimal scenario model from among the scenario models prepared for respective ones of the model classes.Type: ApplicationFiled: August 14, 2023Publication date: April 4, 2024Applicant: Hitachi, Ltd.Inventors: Alexander Adam LAURENCE, Keiro Muro, Daiwa Satoh
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Publication number: 20240103505Abstract: A calculation system that, in an environment based on a digital twin to which the assets are hierarchically connected, executes a simulation regarding the assets on the basis of an output specification regarding a sampling rate and target accuracy that is target accuracy of calculation processing, the calculation system includes a requirement condition calculation unit configured to calculate an output specification to be required for a downstream hierarchy, and a requirement adjustment unit configured to adjust the output specification of a hierarchy that receives a requirement on the basis of the requirement received from the downstream hierarchy, and the requirement condition calculation unit calculates an output specification to be required for an upstream hierarchy on the basis of the output specification adjusted by the requirement adjustment unit.Type: ApplicationFiled: September 12, 2023Publication date: March 28, 2024Applicant: HITACHI, LTD.Inventors: Keiro Muro, Yoshinari Hori
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Patent number: 11625029Abstract: A manufacturing condition setting automating apparatus includes: a quality judging unit that computes a present process quality from facility data at predetermined time intervals, and judges whether or not it is in a quality tolerance range; a manufacturing condition candidate creating unit that computes a feature quantity, searches a database for condition change cases having similar feature quantities, tabulates condition change cases basis on whether the condition change cases are successes or failures, and outputs manufacturing condition candidates in descending order of rates of successes; an imbalance-preventing manufacturing condition candidate creating unit that changes scores that decide ranks of manufacturing condition candidates, and creates a ranking of manufacturing condition candidates; and a manufacturing condition output unit that outputs a set value of a condition change of a top manufacturing condition candidate to the manufacturing facility, and registers a new condition change in the condiType: GrantFiled: February 18, 2021Date of Patent: April 11, 2023Assignee: HITACHI, LTD.Inventors: Masakazu Takahashi, Takuro Yasui, Keiro Muro
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Publication number: 20230069342Abstract: A computer system that detects an abnormality based on time series data, including: an abnormality diagnosis unit that diagnoses an abnormality of the time series data from a machine learning model created based on learning data; a model degradation detection unit that detects degradation in the machine learning model; a learning curve estimation unit that estimates a learning curve and predicts a number of errors per unit time; a model switch cost calculation unit that calculates a number of errors per unit time of a model in operation, a number of errors per unit time of a switch candidate model, a first total cost and a second total cost; and a model switch time prediction unit that compares the first total cost with the second total cost to calculate switch time of a machine learning model.Type: ApplicationFiled: February 18, 2022Publication date: March 2, 2023Applicant: Hitachi, Ltd.Inventors: Keita Mizushina, Satoshi Katsunuma, Keiro Muro
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Publication number: 20230055564Abstract: A model construction support system supports searching for a feature used to construct a prediction model that outputs an objective variable related to a predicted event for a machine based on explanatory variables, and a division method for dividing the explanatory variables into groups to improve calculation accuracy of the objective variables based on the prediction model. The system divides the explanatory variables into a plurality of groups, calculates accuracy of the features set based on the explanatory variable in the groups, and calculates a score of the feature in the groups based on the accuracy and a support ratio of the explanatory variable to all of the explanatory variables before division. The system calculates accuracy of a group division feature used to divide the explanatory variables, and a score in the groups based on the score and the accuracy in the groups.Type: ApplicationFiled: February 28, 2022Publication date: February 23, 2023Inventor: Keiro MURO
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Patent number: 11500364Abstract: Indexes having local features are automatically selected from sensor data of a plurality of sensors. Sensor data of the plurality of sensors, each associated with the plurality of indexes, is partitioned into a plurality of blocks. A principal component analysis is applied to the sensor data of each of the partitioned blocks and a plurality of principal components are extracted from each of the blocks. A migration distance evaluation unit extracts, from two different blocks, two principal components that form a principal component pair, and calculates a migration distance between each of the principal components regarding the extracted principal component pair. A migration factor index detection unit detects, as a migration factor index, an index among the plurality of indexes configuring the principal components having a large migration distance among the migration distances between each of the principal components calculated by the migration distance evaluation unit.Type: GrantFiled: March 9, 2018Date of Patent: November 15, 2022Assignee: HITACHI, LTD.Inventors: Takuya Komatsuda, Machiko Asaie, Keiro Muro
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Patent number: 11340596Abstract: To optimize an operation of a manufacturing facility by presenting a countermeasure for improving quality, even in a manufacturing process where the product quality changes even under constant manufacturing conditions. A countermeasure recommendation device includes a data acquisition unit for collecting a plurality of pieces of facility data, and assigning a label for each process to each piece of the facility data; a countermeasure detection unit for creating countermeasure record data; a countermeasure recommendation unit for calculating the characteristic amount, extracting the characteristic amount, and selecting the countermeasure related to the extracted characteristic amount; and a countermeasure presentation unit for presenting the countermeasure in a visualized state.Type: GrantFiled: August 30, 2019Date of Patent: May 24, 2022Assignee: HITACHI, LTD.Inventors: Masakazu Takahashi, Keiro Muro
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Publication number: 20220147573Abstract: An apparatus that presents a search condition, which is an execution condition to be searched, for a correlation model that calculates an index related to an execution result of process according to the execution condition from predetermined execution conditions, includes: an importance calculation unit configured to calculate the importance of searching for each of a plurality of divided regions belonging to the search space, which is a space that the execution condition can take; an execution cost calculation unit configured to calculate an execution cost required for the process under the execution condition corresponding to the divided region; and a divided region selection unit and a screen output unit configured to select a divided region to be actually searched from the plurality of divided regions on the basis of the importance and the execution cost, and present an execution condition corresponding to the selected divided region as a search condition.Type: ApplicationFiled: September 22, 2021Publication date: May 12, 2022Inventors: Yoichi KAWACHIYA, Keiro MURO, Hiroaki SHIKANO, Satoru WATANABE
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Patent number: 11275665Abstract: A traceability estimation unit generates batch combination output data configured by a plurality of combinations of a batch in the first process and a batch in the second process, and the feature of the batch. The traceability estimation unit estimates the combination of the batch in the first process and the batch in the second process, which is used as traceability, from the plurality of the combinations of the batches in the batch combination output data by using the feature.Type: GrantFiled: August 26, 2020Date of Patent: March 15, 2022Assignee: HITACHI, LTD.Inventors: Yoichi Kawachiya, Masakazu Takahashi, Keiro Muro
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Publication number: 20220066429Abstract: A manufacturing condition setting automating apparatus includes: a quality judging unit that computes a present process quality from facility data at predetermined time intervals, and judges whether or not it is in a quality tolerance range; a manufacturing condition candidate creating unit that computes a feature quantity, searches a database for condition change cases having similar feature quantities, tabulates condition change cases basis on whether the condition change cases are successes or failures, and outputs manufacturing condition candidates in descending order of rates of successes; an imbalance-preventing manufacturing condition candidate creating unit that changes scores that decide ranks of manufacturing condition candidates, and creates a ranking of manufacturing condition candidates; and a manufacturing condition output unit that outputs a set value of a condition change of a top manufacturing condition candidate to the manufacturing facility, and registers a new condition change in the condiType: ApplicationFiled: February 18, 2021Publication date: March 3, 2022Applicant: HITACHI, LTD.Inventors: Masakazu TAKAHASHI, Takuro YASUI, Keiro MURO
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Patent number: 11157821Abstract: A traceability system includes: a Equipment table that stores production data of a product manufactured in a first process, in which an individual ID is appended to a product; a Equipment table that stores production data of a product manufactured in a second process, in which an individual ID is not appended to a product; a training data setting unit that creates a training data table that stores the Equipment table and the Equipment table, which are correlated with each other; a feature amount extracting unit that calculates a cycle time of a predetermined number of products manufactured in the past in the first process; a model creation section that creates a production time estimation model for estimating a production time at which a product has been manufactured in the second process on the basis of the cycle time of the products; and a production time estimating unit.Type: GrantFiled: May 31, 2018Date of Patent: October 26, 2021Assignee: HITACHI, LTD.Inventors: Qi Xiu, Yoshiko Nagasaka, Keiro Muro, Hiromitsu Nakagawa
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Patent number: 11126948Abstract: An analysis method performed by a computer analyzes analysis data acquired from a system which includes a plurality of devices to manufacture a product. The computer manages a set of values of each field of the analysis data as a column, analyzes a correspondence from a value belonging to a first target column to a value belonging to a second target column, specifies a surjection column pair which is a set of the first target column and the second target column which have a surjective correspondence, generates graph information to manage a graph of tree structure indicating a connection relation of the column by connecting a graph which has nodes of the first target column and the second target column of the surjection column pair, and performs a yield analysis to specify a parameter affecting an evaluation value using the graph information.Type: GrantFiled: March 18, 2019Date of Patent: September 21, 2021Assignee: HITACHI, LTD.Inventor: Keiro Muro
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Patent number: 11113364Abstract: An analysis control device controls an analysis based on time series data for each of a plurality of sensors corresponding to a plurality of components that constitute a target device. The analysis control device acquires sensor data sets belonging to an analysis target time zone among the time series data of each of the plurality of sensors. Each sensor data set includes measurement values measured by a sensor. The analysis control device calculates an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone. The analysis control device sets an execution order of the analysis based on the measurement values of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the calculated evaluation value.Type: GrantFiled: May 8, 2017Date of Patent: September 7, 2021Assignee: Hitachi, Ltd.Inventors: Hiromitsu Nakagawa, Keiro Muro
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Publication number: 20210182167Abstract: A traceability estimation unit generates batch combination output data configured by a plurality of combinations of a batch in the first process and a batch in the second process, and the feature of the batch. The traceability estimation unit estimates the combination of the batch in the first process and the batch in the second process, which is used as traceability, from the plurality of the combinations of the batches in the batch combination output data by using the feature.Type: ApplicationFiled: August 26, 2020Publication date: June 17, 2021Inventors: Yoichi KAWACHIYA, Masakazu TAKAHASHI, Keiro MURO
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Patent number: 10789303Abstract: An information processing system includes: a document reception unit configured to receive multiple pieces of document data; a data storage unit configured to store the received multiple pieces of document data; and a correspondence relation estimation unit configured to estimate a correspondence relation at least between an item in a first document data and an item in a second document data out of the multiple pieces of document data stored in the data storage unit. The correspondence relation estimation unit includes an item-item coupling relation extraction unit configured to extract a coupling relation among items in the first document data and a coupling relation among items in the second document data, and a word relationship extraction unit configured to extract a relevance between a word that appears in an item in the first document data and a word that appears in an item in the second document data.Type: GrantFiled: March 23, 2018Date of Patent: September 29, 2020Assignee: HITACHI LTD.Inventors: Yoshiko Nagasaka, Keiro Muro
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Patent number: 10789166Abstract: A computer system acquires information on a first present input subset selected from first present input data for a first step from a run-time log of the first step, determines whether or not first cache data corresponding to the first present input subset for the first step is present in a cache area with reference to management information, and determines the first cache data as present output data for the first present input data in a case where the first cache data is present.Type: GrantFiled: August 3, 2017Date of Patent: September 29, 2020Assignee: Hitachi, Ltd.Inventors: Cheng Luo, Machiko Asaie, Keiro Muro
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Publication number: 20200249661Abstract: To optimize an operation of a manufacturing facility by presenting a countermeasure for improving quality, even in a manufacturing process where the product quality changes even under constant manufacturing conditions. A countermeasure recommendation device includes a data acquisition unit for collecting a plurality of pieces of facility data, and assigning a label for each process to each piece of the facility data; a countermeasure detection unit for creating countermeasure record data; a countermeasure recommendation unit for calculating the characteristic amount, extracting the characteristic amount, and selecting the countermeasure related to the extracted characteristic amount; and a countermeasure presentation unit for presenting the countermeasure in a visualized state.Type: ApplicationFiled: August 30, 2019Publication date: August 6, 2020Applicant: Hitachi, Ltd.Inventors: Masakazu Takahashi, Keiro Muro
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Publication number: 20200089734Abstract: An analysis control device controls an analysis based on time series data for each of a plurality of sensors corresponding to a plurality of components that constitute a target device. The analysis control device acquires sensor data sets belonging to an analysis target time zone among the time series data of each of the plurality of sensors. Each sensor data set includes measurement values measured by a sensor. The analysis control device calculates an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone. The analysis control device sets an execution order of the analysis based on the measurement values of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the calculated evaluation value.Type: ApplicationFiled: May 8, 2017Publication date: March 19, 2020Applicant: Hitachi, Ltd.Inventors: Hiromitsu Nakagawa, Keiro Muro
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Publication number: 20200042926Abstract: An analysis method performed by a computer analyzes analysis data acquired from a system which includes a plurality of devices to manufacture a product. The computer manages a set of values of each field of the analysis data as a column, analyzes a correspondence from a value belonging to a first target column to a value belonging to a second target column, specifies a surjection column pair which is a set of the first target column and the second target column which have a surjective correspondence, generates graph information to manage a graph of tree structure indicating a connection relation of the column by connecting a graph which has nodes of the first target column and the second target column of the surjection column pair, and performs a yield analysis to specify a parameter affecting an evaluation value using the graph information.Type: ApplicationFiled: March 18, 2019Publication date: February 6, 2020Applicant: HITACHI, LTD.Inventor: Keiro MURO
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Publication number: 20190361809Abstract: A computer system acquires information on a first present input subset selected from first present input data for a first step from a run-time log of the first step, determines whether or not first cache data corresponding to the first present input subset for the first step is present in a cache area with reference to management information, and determines the first cache data as present output data for the first present input data in a case where the first cache data is present.Type: ApplicationFiled: August 3, 2017Publication date: November 28, 2019Inventors: Cheng LUO, Machiko ASAIE, Keiro MURO