Patents by Inventor Keith D. Rule
Keith D. Rule has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11797356Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.Type: GrantFiled: September 11, 2020Date of Patent: October 24, 2023Assignee: Tektronix, Inc.Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
-
Publication number: 20230333148Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.Type: ApplicationFiled: April 14, 2023Publication date: October 19, 2023Applicant: Tektronix, Inc.Inventors: Lance H. Forsberg, Keith D. Rule, David N. Wyban
-
Publication number: 20230012393Abstract: A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client.Type: ApplicationFiled: July 7, 2022Publication date: January 12, 2023Applicant: Tektronix, Inc.Inventor: Keith D. Rule
-
Publication number: 20220268839Abstract: A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.Type: ApplicationFiled: February 25, 2022Publication date: August 25, 2022Inventors: John J. Pickerd, Keith D. Rule, Mark Anderson Smith
-
Publication number: 20220252647Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.Type: ApplicationFiled: February 4, 2022Publication date: August 11, 2022Applicant: Initial State Technologies, Inc.Inventors: Frederick B. Kuhlman, III, Adam M. Reeves, Thomas Buida, Gary J. Waldo, Keith D. Rule, James R. Bailey, Mitchell Parsons
-
Patent number: 11237190Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.Type: GrantFiled: January 6, 2020Date of Patent: February 1, 2022Assignee: Tektronix, Inc.Inventors: Keith D. Rule, Sean T. Marty
-
Publication number: 20210325432Abstract: An oscilloscope includes an input port to receive an input signal, a trigger system coupled to the input port and operable to generate a trigger signal in response to detecting a trigger event in the input signal, the trigger system includes at least one finite state machine, and a snippet compiler configured to accept one or more Declarative Trigger Language (DTL) code snippets as an input, compile the one or more DTL code snippets into one or more state machine op codes, and output the one or more state machine op codes. The trigger system uses the one or more state machine op codes to configure the at least one finite state machine.Type: ApplicationFiled: June 25, 2021Publication date: October 21, 2021Applicant: Tektronix, Inc.Inventors: Aidan A. D. Jensen, Keith D. Rule, Dawson C. Green
-
Patent number: 11018964Abstract: An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare the digitized version of the incoming signal against a nominal pattern at the start to find the Frame Markers and Control Channel data, storing only those Control Channel data values that do not match the current compare pattern, and further by updating the current compare pattern to the new pattern just received, so that only the transitions in the data values are stored, thereby vastly reducing the amount of data presented to the user, but nonetheless retaining the complete substantive history of the Link Training negotiations.Type: GrantFiled: December 30, 2016Date of Patent: May 25, 2021Assignee: Tektronix, Inc.Inventors: David L. Kelly, Patrick A. Smith, Jed H. Andrews, Keith D. Rule
-
Publication number: 20210081257Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.Type: ApplicationFiled: September 11, 2020Publication date: March 18, 2021Applicant: Tektronix, Inc.Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
-
Publication number: 20200233016Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.Type: ApplicationFiled: January 6, 2020Publication date: July 23, 2020Inventors: Keith D. Rule, Sean T. Marty
-
Publication number: 20190113542Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.Type: ApplicationFiled: December 4, 2018Publication date: April 18, 2019Applicant: Tektronix, Inc.Inventors: Aidan A. Daly-Jensen, Keith D. Rule, Dawson C. Green
-
Publication number: 20180356445Abstract: A test and measurement instrument including an interface configured to receive one or more preconditions for data acquisition, the one or more preconditions defining one or more rules to which data received during the data acquisition is to conform, and one or more processors. The one or more processors are configured to receive the one or more preconditions for data acquisition, determine whether the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, configure the test and measurement instrument to implement the one or more preconditions for data acquisition when the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, and generate one or more alerts when the test and measurement instrument cannot be configured to implement the one or more preconditions for data acquisition.Type: ApplicationFiled: June 7, 2018Publication date: December 13, 2018Applicant: Tektronix, Inc.Inventors: David C. Vollum, Seamus L. Brokaw, Byron T. Faber, Keith D. Rule
-
Patent number: 10148547Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.Type: GrantFiled: December 17, 2014Date of Patent: December 4, 2018Assignee: Tektronix, Inc.Inventors: Edward F. Tanous, Keith D. Rule, James Feist
-
Patent number: 9989559Abstract: A test and measurement instrument includes a user interface and a controller. The controller is configured to receive a serial bit stream and apply a logic to the serial bit stream to identify states within the serial bit stream. The result of applying the logic to the serial bit stream is a combined state/bit stream. A regular expression can be applied to the combined state/bit stream: the regular expression can include state information. The controller is also configured to present output data through the user interface in response to the application of the regular expression to the combined state/bit stream.Type: GrantFiled: September 30, 2014Date of Patent: June 5, 2018Assignee: Tektronix, Inc.Inventors: Keith D. Rule, Edward F. Tanous, James Feist
-
Publication number: 20170207987Abstract: An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare the digitized version of the incoming signal against a nominal pattern at the start to find the Frame Markers and Control Channel data, storing only those Control Channel data values that do not match the current compare pattern, and further by updating the current compare pattern to the new pattern just received, so that only the transitions in the data values are stored, thereby vastly reducing the amount of data presented to the user, but nonetheless retaining the complete substantive history of the Link Training negotiations.Type: ApplicationFiled: December 30, 2016Publication date: July 20, 2017Inventors: David L. Kelly, Patrick A. Smith, Jed H. Andrews, Keith D. Rule
-
Patent number: 9338076Abstract: A test-and-measurement instrument is described. The test-and-measurement instrument can store a state machine. As the state machine is used to analyze a bit stream, breadcrumbs can be saved from states in a memory of the state machine. The breadcrumbs can then be used to analyze the operation of the state machine.Type: GrantFiled: December 17, 2014Date of Patent: May 10, 2016Assignee: TEKTRONIX, INC.Inventors: Edward F. Tanous, Keith D. Rule, James Feist
-
Patent number: 9329967Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.Type: GrantFiled: November 13, 2012Date of Patent: May 3, 2016Assignee: TEKTRONIX, INC.Inventors: Keith D. Rule, Walter R. Strand, Keith A. Olson, Michael J. Wadzita, Steve M. Mishler
-
Publication number: 20160119217Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.Type: ApplicationFiled: December 17, 2014Publication date: April 28, 2016Inventors: EDWARD F. TANOUS, KEITH D. RULE, JAMES FEIST
-
Publication number: 20160119218Abstract: A test-and-measurement instrument is described. The test-and-measurement instrument can store a state machine. As the state machine is used to analyze a bit stream, breadcrumbs can be saved from states in a memory of the state machine. The breadcrumbs can then be used to analyze the operation of the state machine.Type: ApplicationFiled: December 17, 2014Publication date: April 28, 2016Inventors: EDWARD F. TANOUS, KEITH D. RULE, JAMES FEIST
-
Patent number: 9178792Abstract: Embodiments of this invention include a protocol sensitive visual navigation apparatus, and associated methods, for navigating and relating different protocol levels of a protocol. A test and measurement instrument can include the protocol sensitive visual navigation apparatus, which can facilitate analyzing, searching, and measuring various aspects of the different protocol layers and cross-correlating items from one protocol layer to another protocol layer. The type and characteristics of the analysis is informed by a selected protocol layer. Physical layer signals or events can be correlated to protocol level information, thereby increasing an understanding of the overall protocol and associated protocol layers and events.Type: GrantFiled: November 16, 2011Date of Patent: November 3, 2015Assignee: Tektronix, Inc.Inventors: Keith D. Rule, Michael J. Wadzita, Walter R. Strand