Patents by Inventor Ken Gottschalk

Ken Gottschalk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7362450
    Abstract: An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: April 22, 2008
    Assignee: Xerox Corporation
    Inventors: Kamran Zaman, Dante Pietrantoni, Ken Gottschalk, Stanley Pietrzykowski
  • Publication number: 20070146691
    Abstract: An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.
    Type: Application
    Filed: December 23, 2005
    Publication date: June 28, 2007
    Inventors: Kamran Zaman, Dante Pietrantoni, Ken Gottschalk, Stanley Pietrzykowski
  • Publication number: 20070146692
    Abstract: An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source via a plurality of optical fibers onto the coated substrate, reflecting the visible electromagnetic radiation off the coated substrate as a reflected image, and recording the reflected image with a photosensitive device to form a recorded image.
    Type: Application
    Filed: December 23, 2005
    Publication date: June 28, 2007
    Inventors: Kamran Zaman, Dante Pietrantoni, Ken Gottschalk, Stanley Pietrzykowski